A Low Capture Power Test Generation Method Based on Capture Safe Test Vector Manipulation

Toshinori HOSOKAWA  Atsushi HIRAI  Yukari YAMAUCHI  Masayuki Arai  

Publication:   IEICE TRANSACTIONS on Information and Systems
Publicized: 2017/06/06
DOI: 10.1587/transinf.2016EDP7418
Full Text: PDF(693.1KB)