A Dependable Power Grid Optimization Algorithm Considering Via Reliability

Haruo MIKI  Masaya YOSHIKAWA  Masahiro FUKUI  Shuji TSUKIYAMA 

Publication
A - Abstracts of IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences (Japanese Edition)  Vol.J95-A  No.4  pp.367-374
Publication Date: 2012/04/01
Online ISSN: 1881-0195
Print ISSN: 0913-5707
Type of Manuscript: PAPER
Category: 
Keyword: 
power grid optimization,  via,  reliability,  electro migration,  wiring congestion, 

Full Text(in Japanese): PDF(1.1MB)

Summary: 
Recently, the fine-pattern process approaching to physical limit and the rise of heat density become major factors of reliability degradation of LSI. Especially the reliability problem in power supply networko ccurs more remarkably in vias. This paper gives minimum mean life time as design restrictions, and the algorithm not only satisfies the design restrictions, but obtains a solution of more reliable power supply wiring by taking the trade-off relation with other optimized indices, such as a wiring congestion degree, IR drops, and electro migration into consideration. It also includes a function which increases via area to improve the reliability of via.