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Study on Diffusion Phenomena and Dissipation Factor of Valve Metals (Hf, Zr, Nb, Ta) Double-Layered Anodized Thin Film Capacitor
C - Abstracts of IEICE TRANSACTIONS on Electronics (Japanese Edition)
Publication Date: 2009/06/01
Online ISSN: 1881-0217
Print ISSN: 1345-2827
Type of Manuscript: LETTER
(Hf/Nb , Zr/Nb , Hf/Ta , Zr/Ta) double-layered anodized thin films , dissipation factor , diffusion phenomena ,
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I examined the diffusion of the composed elements at Hf/Nb, Zr/Nb, Hf/Ta and Zr/Ta double-layered anodized films and the loss characteristic which are simultaneous with those. As a result, the diffusion of metals from the under layer to the upper layered film was observed at the only Hf/Nb double-layered anodized film, and low dielectric loss (tan δ = 0.004) was obtained at the Hf/Ta double-layered anodized film capacitor.