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Feasibility Evaluation of the Statistical Delay Quality Model (SDQM)
D - Abstracts of IEICE TRANSACTIONS on Information and Systems (Japanese Edition) Vol.J89-D No.8 pp.1717-1728
Publication Date: 2006/08/01
Online ISSN: 1881-0225
Print ISSN: 1880-4535
Type of Manuscript: Special Section PAPER (Special Section on Dependable Computing)
transition delay fault,
Full Text(in Japanese): PDF(724.8KB)
The transition delay fault model has been widely used for quality grading of delay testing. However, the detectability of small delay defects was not clear because it focused only on a logical coverage of test vectors. We applied the statistical delay quality model (SDQM) to a large data set and confirmed its feasibility. The SDQM reflects fabrication process quality, design delay quality, test timing accuracy, and test pattern quality. Our new experiments showed that this measure could be calculated by simulating test patterns within reasonable CPU time and using a reasonable amount of memory. We showed quantitatively that the transition test patterns are not good at detecting small delay defects for long paths, and that they need improvement of algorithm.