Properties of Generalized Feedback Shift Registers for Secure Scan Design

Hideo FUJIWARA  Katsuya FUJIWARA  

Publication
IEICE TRANSACTIONS on Information and Systems   Vol.E99-D   No.4   pp.1255-1258
Publication Date: 2016/04/01
Online ISSN: 1745-1361
Type of Manuscript: LETTER
Category: Dependable Computing
Keyword: 
design-for-testability,  scan design,  generalized feedback/feed-forward shift registers,  security,  scan-based side-channel attack,  

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Summary: 
In our previous work [12], [13], we introduced generalized feed-forward shift registers (GF2SR, for short) to apply them to secure and testable scan design. In this paper, we introduce another class of generalized shift registers called generalized feedback shift registers (GFSR, for short), and consider the properties of GFSR that are useful for secure scan design. We present how to control/observe GFSR to guarantee scan-in and scan-out operations that can be overlapped in the same way as the conventional scan testing. Testability and security of scan design using GFSR are considered. The cardinality of each class is clarified. We also present how to design strongly secure GFSR as well as GF2SR considered in [13].