For Full-Text PDF, please login, if you are a member of IEICE,|
or go to Pay Per View on menu list, if you are a nonmember of IEICE.
A Highly-Adaptable and Small-Sized In-Field Power Analyzer for Low-Power IoT Devices
Ryosuke KITAYAMA Takashi TAKENAKA Masao YANAGISAWA Nozomu TOGAWA
IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2016/12/01
Online ISSN: 1745-1337
Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
IoT, power analyzer, noise reduction, signal-averaging method, scalable measurement,
Full Text: PDF(2.6MB)>>
Power analysis for IoT devices is strongly required to protect attacks from malicious attackers. It is also very important to reduce power consumption itself of IoT devices. In this paper, we propose a highly-adaptable and small-sized in-field power analyzer for low-power IoT devices. The proposed power analyzer has the following advantages: (A) The proposed power analyzer realizes signal-averaging noise reduction with synchronization signal lines and thus it can reduce wide frequency range of noises; (B) The proposed power analyzer partitions a long-term power analysis process into several analysis segments and measures voltages and currents of each analysis segment by using small amount of data memories. By combining these analysis segments, we can obtain long-term analysis results; (C) The proposed power analyzer has two amplifiers that amplify current signals adaptively depending on their magnitude. Hence maximum readable current can be increased with keeping minimum readable current small enough. Since all of (A), (B) and (C) do not require complicated mechanisms nor circuits, the proposed power analyzer is implemented on just a 2.5cm×3.3cm board, which is the smallest size among the other existing power analyzers for IoT devices. We have measured power and energy consumption of the AES encryption process on the IoT device and demonstrated that the proposed power analyzer has only up to 1.17% measurement errors compared to a high-precision oscilloscope.