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Characterization of Crossing Transmission Line Using Two-Port Measurements for Millimeter-Wave CMOS Circuit Design
Korkut Kaan TOKGOZ Kimsrun LIM Seitarou KAWAI Nurul FAJRI Kenichi OKADA Akira MATSUZAWA
IEICE TRANSACTIONS on Electronics
Publication Date: 2015/01/01
Online ISSN: 1745-1353
Type of Manuscript: PAPER
Category: Microwaves, Millimeter-Waves
crossing transmission line, de-embedding, characterization, millimeter-wave, reduced port,
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A multi-port device is characterized using measurement results of a two-port Vector Network Analyzer (VNA) with four different structures. The loads used as terminations are open-, or short-circuited transmission lines (TLs), which are characterized along with Ground-Signal-Ground pads based on L-2L de-embedding method. A new characterization method for a four-port device is introduced along with its theory. The method is validated using simulation and measurement results. The characterized four-port device is a Crossing Transmission Line (CTL), mainly used for over-pass or under-pass of RF signals. Four measurement results are used to characterize the CTL. The S-parameter response of the CTL is found. To compare the results, reconstructed responses compared with the measurements. Results show good agreement between the measured and modeled results from 1 GHz to 110 GHz.