Observations of Structural Transition of Tin Plated Fretting Contacts Using FIB-SEM

Tetsuya ITO  Shigeru OGIHARA  Yasuhiro HATTORI  

Publication
IEICE TRANSACTIONS on Electronics   Vol.E94-C   No.9   pp.1350-1355
Publication Date: 2011/09/01
Online ISSN: 1745-1353
DOI: 10.1587/transele.E94.C.1350
Print ISSN: 0916-8516
Type of Manuscript: Special Section PAPER (Special Section on Recent Development of Electro-Mechanical Devices – Papers selected from International Session on Electro-Mechanical Devices (IS-EMD2010) and other research results –)
Category: 
Keyword: 
fretting,  FIB-SEM,  

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Summary: 
In recent years, there has been increasing demand to miniaturize wiring harness connectors in automobiles due to the increasing volume of electronic equipment and so on. With this demand, contact failure caused by the fretting corrosion seems to become a serious problem in the future. In this report, three-dimensional observations using Focused Ion Beam (FIB)-SEM method have been made for tin plated fretting contacts before and after the contact resistance increase with tin plating thickness 5 µm. With these observations, the three dimensional structural transition from tin to tin oxide have been examined.