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Grouped Scan Slice Repetition Method for Reducing Test Data Volume and Test Application Time
Yongjoon KIM
Myung-Hoon YANG
Jaeseok PARK
Eunsei PARK
Sungho KANG
Publication
IEICE TRANSACTIONS on Information and Systems Vol.E92-D No.7 pp.1462-1465
Publication Date: 2009/07/01
Online ISSN: 1745-1361
Print ISSN: 0916-8532
Type of Manuscript: LETTER
Category: VLSI Systems
Keyword:
design for testability (DfT),
scan testing,
test data compression,
Full Text: PDF(886.9KB)
Summary:
This paper presents a grouped scan slice encoding technique using scan slice repetition to simultaneously reduce test data volume and test application time. Using this method, many scan slices that would be incompatible with the conventional selective scan slice method can be encoded as compatible scan slices. Experiments were performed with ISCAS'89 and ITC'99 benchmark circuits, and results show the effectiveness of the proposed method.
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