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Wide Range CMOS Voltage Detector with Low Current Consumption and Low Temperature Variation
Kawori TAKAKUBO Hajime TAKAKUBO
IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2009/02/01
Online ISSN: 1745-1337
Print ISSN: 0916-8508
Type of Manuscript: Special Section PAPER (Special Section on Analog Circuit Techniques and Related Topics)
voltage detector, CMOS inverter, power line operation, wide range, low current consumption, low temperature variation,
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A wide range CMOS voltage detector with low current consumption consisting of CMOS inverters operating in both weak inversion and saturation region is proposed. A terminal of power supply for CMOS inverter can be expanded to a signal input terminal. A voltage-detection point and hysteresis characteristics of the proposed circuit can be designed by geometrical factor in MOSFET and an external bias voltage. The core circuit elements are fabricated in standard 0.18 µm CMOS process and measured to confirm the operation. The detectable voltage is from 0.3 V to 1.8 V. The current consumption of voltage detection, standby current, is changed from 65 pA for Vin = 0.3 V to 5.5 µA for Vin = 1.8 V. The thermal characteristics from 250 K to 400 K are also considered. The measured temperature coefficient of the proposed voltage-detector core operating in weak inversion region is 4 ppm/K and that in saturation region is 10 ppm/K. The proposed voltage detector can be implemented with tiny chip area and is expected to an on-chip voltage detector of power supply for mobile application systems.