Huffman-Based Test Response Coding

Hideyuki ICHIHARA  Michihiro SHINTANI  Tomoo INOUE 

Publication
IEICE TRANSACTIONS on Information and Systems  Vol.E88-D  No.1  pp.158-161
Publication Date: 2005/01/01
Online ISSN: 
Print ISSN: 0916-8532
Type of Manuscript: LETTER
Category: Dependable Computing
Keyword: 
Huffman code,  test compression,  test response,  test application time,  ATE, 

Full Text: PDF(103.7KB)

Summary: 
Test compression / decompression is an efficient method for reducing the test application cost. In this letter we propose a response compression method based on Huffman coding. The proposed method guarantees zero-aliasing and it is independent of the fault model and the structure of a circuit-under-test. Experimental results of the compression ratio and the size of the encoder for the proposed method are presented.