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Preemptive System-on-Chip Test Scheduling
IEICE TRANSACTIONS on Information and Systems Vol.E87-D No.3 pp.620-629
Publication Date: 2004/03/01
Print ISSN: 0916-8532
Type of Manuscript: Special Section PAPER (Special Section on Test and Verification of VLSI)
Category: SoC Testing
test access mechanism design,
Full Text: PDF(3.2MB)
In this paper, we propose a preemptive test scheduling technique (a test can be interrupted and later resumed) for core-based systems with the objective to minimize the test application time. We make use of reconfigurable core test wrappers in order to increase the flexibility in the scheduling process. The advantage with such a wrapper is that it is not limited to a single TAM (test access mechanism) bandwidth (wrapper chain configuration) at each core. We model the scheduling problem as a Bin-packing problem, and we discuss the transformation: number of TAM wires (wrapper-chains) versus test time in combination with preemption, as well as the possibilities and the limitations to achieve an optimal solution in respect to test application time. We have implemented the proposed preemptive test scheduling algorithm, and we have through experiments demonstrated its efficiency.