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Two-Sapphire-Rod-Resonator Method to Measure the Surface Resistance of High-Tc Superconductor Films
Toru HASHIMOTO Yoshio KOBAYASHI
IEICE TRANSACTIONS on Electronics
Publication Date: 2004/05/01
Print ISSN: 0916-8516
Type of Manuscript: Special Section PAPER (Special Section on Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits)
Category: General Methods, Materials, and Passive Circuits
two-sapphire-rod-resonator method, surface resistance, high-Tc superconductor, open-type, cavity-type, closed-type, mode chart,
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Precise designs are presented for sapphire rod resonators of three types, which have been proposed by the IEC/TC90/WG8 in the standard measurement method of the surface resistance Rs of high-Tc superconductor (HTS) films; an open-type, a cavity-type and a closed-type. In order to separate TE011 and TE013 modes, which are used in Rs measurements, from the other modes, appropriate dimensions for these three resonators are determined from mode charts calculated from a rigorous analysis based on the mode matching method, taking account of an uniaxial-anisotropic characteristic of sapphire. Comparison of the open-type resonator with the closed-type is performed. For the open-type, the unloaded Q values of both the TE011 and TE013 modes are reduced by radiations of a leaky state TM310 mode. Finally, validity of the design and a two-sapphire-rod-resonator method will be verified by experiments.