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Standardization of Measurement Methods of Low-Loss Dielectrics and High-Temperature Superconducting Films
IEICE TRANSACTIONS on Electronics
Publication Date: 2004/05/01
Print ISSN: 0916-8516
Type of Manuscript: INVITED PAPER (Special Section on Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits)
microwave, millimeter wave, standardization, low-loss dielectric, high-temperature superconductor,
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The present state of IEC and JIS standards is reviewed on measurement methods of low-loss dielectric and high-tempera-ture superconductor (HTS) materials in the microwave and millimeter wave range. Four resonance methods are discussed actually, that is, a two-dielectric resonator method for dielectric rod measurements, a two-sapphire resonator method for HTS film measurements, a cavity resonator method for microwave measurements of dielectric plates and a cutoff circular waveguide method for millimeter wave measurements of dielectric plates. These methods realize the high accuracy sufficient for measurements of temperature dependence of material properties.