An Image-Type Dielectric Resonator Method to Measure Surface Resistance of a High-Tc Superconductor Film

Toru HASHIMOTO  Yoshio KOBAYASHI  

Publication
IEICE TRANSACTIONS on Electronics   Vol.E86-C   No.1   pp.30-36
Publication Date: 2003/01/01
Online ISSN: 
Print ISSN: 0916-8516
Type of Manuscript: Special Section PAPER (Special Issue on Superconductor Digital/Analog Circuit Technologies)
Category: HTS Digital Applications
Keyword: 
surface resistance,  high-Tc superconductors,  image-type dielectric resonator,  mode matching method,  

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Summary: 
A new measurement method using two resonance modes, the TE021 and TE012 modes, in an image-type dielectric resonator is proposed to measure the surface resistance Rs of only one high-Tc superconductor (HTS) film and the loss tangent tan δ of a sapphire rod separately, precisely and nondestructively. The image-type resonator is constructed by placing a sapphire rod in a bottom of a conductor cavity made of two HTS films and a copper ring. This resonator is designed from the mode charts calculated on the basis of the rigorous analysis by the mode matching method, taking account of an uniaxial-anisotropic characteristic of sapphire. It is verified that the mode charts are also effective to identify many resonance modes observed in measurement. The temperature dependence of Rs of one YBCO film was measured at 19.3 GHz by this method. The measured result agreed very well with one measured by the conventional two-dielectric resonator method. As a result, it was verified that this method is useful to evaluate Rs value of one HTS film with no damage.