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Measurement of a Depth Profile in a Random Medium Using Coherent Backscattering of Light
Yasuyuki OKAMURA Sadahiko YAMAMOTO
IEICE TRANSACTIONS on Electronics
Publication Date: 2000/12/25
Print ISSN: 0916-8516
Type of Manuscript: Special Section PAPER (Special Issue on Problems of Random Scattering and Electromagnetic Wave Sensing)
Category: Scattering and Propagation in Random Media
random medium, coherent backscattering, image processing, target tracking,
Full Text: PDF(561.2KB)>>
An averaged intensity peak profile of light scattered from a random medium depends on a thickness of a sample as well as parameters such as a volume fraction and a size of particles composing the medium. We used this dependence to measure a depth profile varied in the random medium. We demonstrated the possible simultaneous measurement of a transport mean free path and a depth of an aqueous suspension of titanium particles.