Extra Wideband Polarimetry, Interferometry and Polarimetric Interferometry in Synthetic Aperture Remote Sensing

Wolfgang-Martin BOERNER  Yoshio YAMAGUCHI  

Publication
IEICE TRANSACTIONS on Communications   Vol.E83-B   No.9   pp.1906-1915
Publication Date: 2000/09/25
Online ISSN: 
DOI: 
Print ISSN: 0916-8516
Type of Manuscript: INVITED PAPER (Special Issue on Advances in Radar Systems)
Category: 
Keyword: 
polarimetry,  interferometry,  polarimetric interferometry,  synthetic aperture radar (SAR),  

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Summary: 
The development of Radar Polarimetry and Radar Interferometry is advancing rapidly. Whereas with radar polarimetry, the textural fine-structure, target orientation, symmetries and material constituents can be recovered with considerable improvement above that of standard amplitude-only radar; with radar interferometry the spatial (in depth) structure can be explored. In Polarimetric Interferometric Synthetic Aperture Radar (POL-IN-SAR) Imaging, it is possible to recover such co-registered textural and spatial information from POL-IN-SAR digital image data sets simultaneously, including the extraction of Digital Elevation Maps (DEM) from either Polarimetric (scattering matrix) or Interferometric (single platform: dual antenna) SAR systems. Simultaneous Polarimetric-plus-Interferometric SAR offers the additional benefit of obtaining co-registered textural-plus-spatial three-dimensional POL-IN-DEM information, which when applied to Repeat-Pass Image-Overlay Interferometry provides differential background validation, stress assessment and environmental stress-change information with high accuracy. Then, by either designing Multiple Dual-Polarization Antenna POL-IN-SAR systems or by applying advanced POL-IN-SAR image compression techniques, it will result in POL-arimetric TOMO-graphic (Multi-Inter-ferometric) SAR or POL-TOMO-SAR Imaging. This is of direct relevance to local-to-global environmental background validation, stress assessment and stress-change monitoring of the terrestrial and planetary covers.