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Effects of Simulated Annealing in the Resonant-Tunneling Resistive-Fuse Network for Early Vision
IEICE TRANSACTIONS on Electronics
Publication Date: 1996/11/25
Print ISSN: 0916-8516
Type of Manuscript: Special Section PAPER (Special Issue on Quantum Effect Devices and Their Fabrication Technologies)
resonant tunneling diode, simulated annealing, resistive fuse, image processing,
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The resistive-fuse network for early vision was studied using circuit simulation to clarify the potential of implementation with resonant tunneling diodes (RTDs). To over-come the fundamental problem of the RTD network, i.e., the RTDs cannot perform simulated annealing (SA), pseudo SAs were proposed. These methods are based on the time-variation of the input signal strength, and are found to be effective in restoring images. A resistive-fuse network is shown to be one of the most promising applications of RTDs.