Effects of Simulated Annealing in the Resonant-Tunneling Resistive-Fuse Network for Early Vision

Koichi MAEZAWA 

Publication
IEICE TRANSACTIONS on Electronics  Vol.E79-C  No.11  pp.1543-1549
Publication Date: 1996/11/20
Online ISSN: 
Print ISSN: 0916-8516
Type of Manuscript: Special Section PAPER (Special Issue on Quantum Effect Devices and Their Fabrication Technologies)
Category: 
Keyword: 
resonant tunneling diode,  simulated annealing,  resistive fuse,  image processing, 

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Summary: 
The resistive-fuse network for early vision was studied using circuit simulation to clarify the potential of implementation with resonant tunneling diodes (RTDs). To over-come the fundamental problem of the RTD network, i.e., the RTDs cannot perform simulated annealing (SA), pseudo SAs were proposed. These methods are based on the time-variation of the input signal strength, and are found to be effective in restoring images. A resistive-fuse network is shown to be one of the most promising applications of RTDs.