The Investigation of Zirconiated Tungsten Field Emitter by Field Ion Microscopy


IEICE TRANSACTIONS (1976-1990)   Vol.E65   No.9   pp.517-521
Publication Date: 1982/09/25
Online ISSN: 
Print ISSN: 0000-0000
Type of Manuscript: PAPER
Category: Electron Devices

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In the previous paper, the chemical composition analysis of Zirconiated tungsten field emitters was reported. In this paper, behavior of Zr atoms on a W-single crystal surface in the nitrogen atmosphere and in the oxygen was investigated by FIM micrograph. Image patterns of the micrograph were taken when the W-single crystal emitter tip of 100 direction was annealed at 1100 for 10 minutes in the presence of 310-6 torr oxygen gas. It seems suitable to explain on the image patterns that zirconium oxide layers are formed. However, the phenomenon of the (100) surface build-up was not observed as much degree in the oxygen presence as in the presence of 610-6 torr nitrogen gas.