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Utilization of Path-Clustering in Efficient Stress-Control Gate Replacement for NBTI Mitigation
Shumpei MORITA Song BIAN Michihiro SHINTANI Masayuki HIROMOTO Takashi SATO
IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2017/07/01
Online ISSN: 1745-1337
Type of Manuscript: Special Section PAPER (Special Section on Design Methodologies for System on a Chip)
NBTI mitigation, reliability, transistor aging, performance degradation, internal node control,
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Replacement of highly stressed logic gates with internal node control (INC) logics is known to be an effective way to alleviate timing degradation due to NBTI. We propose a path clustering approach to accelerate finding effective replacement gates. Upon the observation that there exist paths that always become timing critical after aging, critical path candidates are clustered to select representative path in each cluster. With efficient data structure to further reduce timing calculation, INC logic optimization has first became tractable in practical time. Through the experiments using a processor, 171x speedup has been demonstrated while retaining almost the same level of mitigation gain.