Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2006/04/01 Vol. E89-DNo. 4pp. 1490-1497 Type of Manuscript: PAPER Category: Dependable Computing Keyword: SoC,
test scheduling,
wrapper,
design for test,
memory BIST,
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2004/06/01 Vol. E87-ANo. 6pp. 1338-1346 Type of Manuscript: Special Section PAPER (Special Section on Papers Selected from 2003 International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC 2003)) Category: Keyword: globally asynchornous locally synchronous (GALS) systems,
pausible clocking,
synchronization,
wrapper,
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2004/03/01 Vol. E87-DNo. 3pp. 609-619 Type of Manuscript: Special Section PAPER (Special Section on Test and Verification of VLSI) Category: SoC Testing Keyword: test scheduling,
test access mechanism,
wrapper,
design for test,
