Keyword : within-die process variation


SET Pulse-Width Measurement Suppressing Pulse-Width Modulation and Within-Die Process Variation Effects
Ryo HARADA Yukio MITSUYAMA Masanori HASHIMOTO Takao ONOYE 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2014/07/01
Vol. E97-A  No. 7 ; pp. 1461-1467
Type of Manuscript:  Special Section PAPER (Special Section on Design Methodologies for System on a Chip)
Category: 
Keyword: 
soft errorsingle event transient (SET)pulse-widthpulse-width modulationmeasurement circuitwithin-die process variation
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