Increasing Importance of Electronic Thermal Noise in Sub-0.1 µm Si-MOSFETs Nobuyuki SANO
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2000/08/20 Vol. E83-CNo. 8pp. 1203-1211 Type of Manuscript: INVITED PAPER (Special Issue on 1999 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD'99)) Category: Device Modeling and Simulation Keyword: Monte Carlo simulation,
current fluctuation,
thermal noise,
shot noise,
central limit theorem,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1998/01/20 Vol. E81-CNo. 1pp. 42-48 Type of Manuscript: Special Section PAPER (Special Issue on Technology Challenges for Single Electron Devices) Category: Keyword: single electron majority logic,
threshold logic,
gate,
circuit,
thermal noise,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1993/06/20 Vol. E76-CNo. 6pp. 925-931 Type of Manuscript: Special Section PAPER (Special Issue on Microwave and Millimeter-Wave Technology for Advanced Functions and Size-Reductions) Category: Keyword: active feedback resonator,
AFR,
microwave resonator,
unloaded Q,
thermal noise,
noise temperature,
Theoretical Analysis of the Capacity Controlled Digital Mobile System in the Presence of Interference and Thermal Noise Hee-Jin LEEShozo KOMAKINorihiko MORINAGA
: Compact Device Model--