Keyword : testing


Spectrum-Based Fault Localization Using Fault Triggering Model to Refine Fault Ranking List
Yong WANG Zhiqiu HUANG Rongcun WANG Qiao YU 
Publication:   
Publication Date: 2018/10/01
Vol. E101-D  No. 10 ; pp. 2436-2446
Type of Manuscript:  PAPER
Category: Software Engineering
Keyword: 
fault localizationsoftware debuggingtesting
 Summary | Full Text:PDF(824.9KB)

Power-Supply-Noise-Aware Timing Analysis and Test Pattern Regeneration
Cheng-Yu HAN Yu-Ching LI Hao-Tien KAN James Chien-Mo LI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2016/12/01
Vol. E99-A  No. 12 ; pp. 2320-2327
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: 
Keyword: 
IR-droppower-supply-noisetiming analysistesting
 Summary | Full Text:PDF(1.1MB)

Design for Testability That Reduces Linearity Testing Time of SAR ADCs
Tomohiko OGAWA Haruo KOBAYASHI Satoshi UEMORI Yohei TAN Satoshi ITO Nobukazu TAKAI Takahiro J. YAMAGUCHI Kiichi NIITSU 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/06/01
Vol. E94-C  No. 6 ; pp. 1061-1064
Type of Manuscript:  BRIEF PAPER
Category: 
Keyword: 
SAR ADCtestingDC linearitydesign for testabilitybuilt-in self-test
 Summary | Full Text:PDF(462.8KB)

Modeling, Verification and Testing of Web Applications Using Model Checker
Kei HOMMA Satoru IZUMI Kaoru TAKAHASHI Atsushi TOGASHI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2011/05/01
Vol. E94-D  No. 5 ; pp. 989-999
Type of Manuscript:  Special Section PAPER (Special Section on Formal Approach)
Category: Software Development Methodology
Keyword: 
Web applicationmodelingtestingautomatamodel checkingSpin
 Summary | Full Text:PDF(523.7KB)

An Efficient Fault Syndromes Simulator for SRAM Memories
Wan Zuha WAN HASAN Izhal ABD HALIN Roslina MOHD SIDEK Masuri OTHMAN 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2009/05/01
Vol. E92-C  No. 5 ; pp. 639-646
Type of Manuscript:  Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
testingdiagnosiscoupling faultsstuck-at faults March test algorithmbuilt-in self-test (BIST)built-in self-diagnosis (BISD)automated march-based test algorithmSRAM
 Summary | Full Text:PDF(1.8MB)

Analysis and Testing of Bridging Faults in CMOS Synchronous Sequential Circuits
Yukiya MIURA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2004/03/01
Vol. E87-D  No. 3 ; pp. 564-570
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSI)
Category: Fault Detection
Keyword: 
bridging faultsCMOS synchronous sequential circuitsfault analysistesting
 Summary | Full Text:PDF(796.9KB)

Diagnosing Binary Content Addressable Memories with Comparison and RAM Faults
Jin-Fu LI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2004/03/01
Vol. E87-D  No. 3 ; pp. 601-608
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSI)
Category: Memory Testing
Keyword: 
content addressable memoriestestingdiagnosismarch test
 Summary | Full Text:PDF(437KB)

Test Generation for SI Asynchronous Circuits with Undetectable Faults from Signal Transition Graph Specification
Eunjung OH Jeong-Gun LEE Dong-Ik LEE Ho-Yong CHOI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2001/06/01
Vol. E84-A  No. 6 ; pp. 1506-1514
Type of Manuscript:  Special Section PAPER (Special Section on Papers Selected from 2000 International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC 2000))
Category: 
Keyword: 
ATPGSI asynchronous circuitssignal transition graphtesting
 Summary | Full Text:PDF(777.7KB)

Fast Testable Design for SRAM-Based FPGAs
Abderrahim DOUMAR Toshiaki OHMAMEUDA Hideo ITO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2000/05/25
Vol. E83-D  No. 5 ; pp. 1116-1127
Type of Manuscript:  PAPER
Category: Fault Tolerance
Keyword: 
field programmable gate array (FPGA)testingdesign for testingshifting configurations
 Summary | Full Text:PDF(1.3MB)

Fault Behavior and Change in Internal Condition of Mixed-Signal Circuits
Yukiya MIURA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2000/04/25
Vol. E83-D  No. 4 ; pp. 943-945
Type of Manuscript:  LETTER
Category: Fault Tolerance
Keyword: 
CMOS mixed-signal circuitsfault analysisMOS transistorsoperation regionstesting
 Summary | Full Text:PDF(37.2KB)

OTA-C Based BIST Structure for Analog Circuits
Cheng-Chung HSU Wu-Shiung FENG 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2000/04/25
Vol. E83-A  No. 4 ; pp. 771-773
Type of Manuscript:  LETTER
Category: VLSI Design Technology and CAD
Keyword: 
built-in self-test (BIST)operational transconductance amplifier (OTA)analog circuitfault diagnosistesting
 Summary | Full Text:PDF(642.8KB)

Electro-Optic Testing Technology for High-Speed LSIs
Tadao NAGATSUMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/04/25
Vol. E79-C  No. 4 ; pp. 482-488
Type of Manuscript:  INVITED PAPER (Special Issue on Ultra-High-Speed LSIs)
Category: 
Keyword: 
electro-opticsPockels effectsamplingpulse lasertesting
 Summary | Full Text:PDF(775.9KB)

Applying OSI Systems Management Standards to Remotely Controlled Virtual Path Testing in ATM Networks
Satoru OHTA Nobuo FUJII 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 1993/03/25
Vol. E76-B  No. 3 ; pp. 280-290
Type of Manuscript:  Special Section PAPER (Special Issue on Broadband ISDN --Application, Networking and Management--)
Category: 
Keyword: 
communication systems and transmission equipmentATMtestingnetwork managementOSI systems managementmanaged object
 Summary | Full Text:PDF(974KB)

Verification of Register Transfer Level (RTL) Designs
Alberto Palacios PAWLOVSKY Sachio NAITO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1992/11/25
Vol. E75-D  No. 6 ; pp. 785-791
Type of Manuscript:  Special Section PAPER (Special Issue on Pacific Rim International Symposium on Fault Tolerant Systems)
Category: 
Keyword: 
fault analysistestingverificationhardware description languagesregular expressionsdirected graphs
 Summary | Full Text:PDF(634.1KB)