Keyword : test data compression


A Novel Dictionary-Based Method for Test Data Compression Using Heuristic Algorithm
Diancheng WU Jiarui LI Leiou WANG Donghui WANG Chengpeng HAO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2016/06/01
Vol. E99-C  No. 6 ; pp. 730-733
Type of Manuscript:  BRIEF PAPER
Category: Semiconductor Materials and Devices
Keyword: 
automatic test equipmenttest data compressionheuristic algorithmmaximum clique problemdictionary-based compression
 Summary | Full Text:PDF(948.8KB)

A Novel Test Data Compression Scheme for SoCs Based on Block Merging and Compatibility
Tiebin WU Hengzhu LIU Botao ZHANG 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2014/07/01
Vol. E97-A  No. 7 ; pp. 1452-1460
Type of Manuscript:  Special Section PAPER (Special Section on Design Methodologies for System on a Chip)
Category: 
Keyword: 
test data compressionblock mergingcompatibilitytest application timecode-based testingsystem-on-chip (SoC)
 Summary | Full Text:PDF(1012.7KB)

A Novel Pattern Run-Length Coding Method for Test Data Compression
Diancheng WU Yu LIU Hao ZHU Donghui WANG Chengpeng HAO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2013/09/01
Vol. E96-C  No. 9 ; pp. 1201-1204
Type of Manuscript:  BRIEF PAPER
Category: Integrated Electronics
Keyword: 
Automatic Test Equipmenttest data compressionpattern run-length codingX-assigning
 Summary | Full Text:PDF(344.2KB)

Extended Selective Encoding of Scan Slices for Reducing Test Data and Test Power
Jun LIU Yinhe HAN Xiaowei LI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2010/08/01
Vol. E93-D  No. 8 ; pp. 2223-2232
Type of Manuscript:  PAPER
Category: Information Network
Keyword: 
selective encodingtest data compressiontest power reductionflexible groupingX-filling
 Summary | Full Text:PDF(565.6KB)

Selective Scan Slice Grouping Technique for Efficient Test Data Compression
Yongjoon KIM Jaeseok PARK Sungho KANG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2010/02/01
Vol. E93-D  No. 2 ; pp. 380-383
Type of Manuscript:  LETTER
Category: Dependable Computing
Keyword: 
design for testability (DfT)scan testingSoC testtest data compression
 Summary | Full Text:PDF(122.9KB)

X-Handling for Current X-Tolerant Compactors with More Unknowns and Maximal Compaction
Youhua SHI Nozomu TOGAWA Masao YANAGISAWA Tatsuo OHTSUKI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2009/12/01
Vol. E92-A  No. 12 ; pp. 3119-3127
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Logic Synthesis, Test and Verfication
Keyword: 
scan testtest data compressionX-masking
 Summary | Full Text:PDF(851.7KB)

Grouped Scan Slice Repetition Method for Reducing Test Data Volume and Test Application Time
Yongjoon KIM Myung-Hoon YANG Jaeseok PARK Eunsei PARK Sungho KANG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2009/07/01
Vol. E92-D  No. 7 ; pp. 1462-1465
Type of Manuscript:  LETTER
Category: VLSI Systems
Keyword: 
design for testability (DfT)scan testingtest data compression
 Summary | Full Text:PDF(887.3KB)

A Unified Test Compression Technique for Scan Stimulus and Unknown Masking Data with No Test Loss
Youhua SHI Nozomu TOGAWA Masao YANAGISAWA Tatsuo OHTSUKI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2008/12/01
Vol. E91-A  No. 12 ; pp. 3514-3523
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Logic Synthesis, Test and Verification
Keyword: 
scan testtest data compressionX-masking
 Summary | Full Text:PDF(583.3KB)

Test Data Compression for Scan-Based BIST Aiming at 100x Compression Rate
Masayuki ARAI Satoshi FUKUMOTO Kazuhiko IWASAKI Tatsuru MATSUO Takahisa HIRAIDE Hideaki KONISHI Michiaki EMORI Takashi AIKYO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/03/01
Vol. E91-D  No. 3 ; pp. 726-735
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSIs)
Category: Test Compression
Keyword: 
test data compressiontest response compactionBIST-aided scan testX-valueATPG
 Summary | Full Text:PDF(1MB)

Low-Cost IP Core Test Using Tri-Template-Based Codes
Gang ZENG Hideo ITO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2007/01/01
Vol. E90-D  No. 1 ; pp. 288-295
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
design for testabilityIP core testingtest cost reductiontest data compression
 Summary | Full Text:PDF(475KB)

Selective Low-Care Coding: A Means for Test Data Compression in Circuits with Multiple Scan Chains
Youhua SHI Nozomu TOGAWA Shinji KIMURA Masao YANAGISAWA Tatsuo OHTSUKI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2006/04/01
Vol. E89-A  No. 4 ; pp. 996-1004
Type of Manuscript:  Special Section PAPER (Special Section on Selected Papers from the 18th Workshop on Circuits and Systems in Karuizawa)
Category: 
Keyword: 
test data compressiontest channelsscan test
 Summary | Full Text:PDF(445.2KB)

Concurrent Core Testing for SOC Using Merged Test Set and Scan Tree
Gang ZENG Hideo ITO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2006/03/01
Vol. E89-D  No. 3 ; pp. 1157-1164
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
concurrent testingSOC testingtest cost reductiontest data compression
 Summary | Full Text:PDF(786.2KB)

X-Tolerant Test Data Compression for SOC with Enhanced Diagnosis Capability
Gang ZENG Hideo ITO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2005/07/01
Vol. E88-D  No. 7 ; pp. 1662-1670
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
SOC testingtest cost reductiontest data compressionunknown statetest diagnosis
 Summary | Full Text:PDF(658.4KB)

A Hybrid Dictionary Test Data Compression for Multiscan-Based Designs
Youhua SHI Shinji KIMURA Masao YANAGISAWA Tatsuo OHTSUKI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2004/12/01
Vol. E87-A  No. 12 ; pp. 3193-3199
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Test
Keyword: 
test data compressiontest slicemultiple scan chainATE
 Summary | Full Text:PDF(738.1KB)

A Selective Scan Chain Reconfiguration through Run-Length Coding for Test Data Compression and Scan Power Reduction
Youhua SHI Shinji KIMURA Masao YANAGISAWA Tatsuo OHTSUKI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2004/12/01
Vol. E87-A  No. 12 ; pp. 3208-3215
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Test
Keyword: 
test data compressionscan chain reconfigurationrun-length codingscan-in power consumption
 Summary | Full Text:PDF(465.2KB)