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Keyword : test data compression

Extended Selective Encoding of Scan Slices for Reducing Test Data and Test Power Jun LIU Yinhe HAN Xiaowei LI
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2010/08/01 Vol. E93-D No. 8 pp. 2223-2232 Type of Manuscript: PAPER Category: Information Network Keyword: selective encoding, test data compression, test power reduction, flexible grouping, X-filling,
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Selective Scan Slice Grouping Technique for Efficient Test Data Compression Yongjoon KIM Jaeseok PARK Sungho KANG
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2010/02/01 Vol. E93-D No. 2 pp. 380-383 Type of Manuscript: LETTER Category: Dependable Computing Keyword: design for testability (DfT), scan testing, SoC test, test data compression,
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X-Handling for Current X-Tolerant Compactors with More Unknowns and Maximal Compaction Youhua SHI Nozomu TOGAWA Masao YANAGISAWA Tatsuo OHTSUKI
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2009/12/01 Vol. E92-A No. 12 pp. 3119-3127 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Logic Synthesis, Test and Verfication Keyword: scan test, test data compression, X-masking,
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Grouped Scan Slice Repetition Method for Reducing Test Data Volume and Test Application Time Yongjoon KIM Myung-Hoon YANG Jaeseok PARK Eunsei PARK Sungho KANG
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2009/07/01 Vol. E92-D No. 7 pp. 1462-1465 Type of Manuscript: LETTER Category: VLSI Systems Keyword: design for testability (DfT), scan testing, test data compression,
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A Unified Test Compression Technique for Scan Stimulus and Unknown Masking Data with No Test Loss Youhua SHI Nozomu TOGAWA Masao YANAGISAWA Tatsuo OHTSUKI
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2008/12/01 Vol. E91-A No. 12 pp. 3514-3523 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Logic Synthesis, Test and Verification Keyword: scan test, test data compression, X-masking,
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Test Data Compression for Scan-Based BIST Aiming at 100x Compression Rate Masayuki ARAI Satoshi FUKUMOTO Kazuhiko IWASAKI Tatsuru MATSUO Takahisa HIRAIDE Hideaki KONISHI Michiaki EMORI Takashi AIKYO
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2008/03/01 Vol. E91-D No. 3 pp. 726-735 Type of Manuscript: Special Section PAPER (Special Section on Test and Verification of VLSIs) Category: Test Compression Keyword: test data compression, test response compaction, BIST-aided scan test, X-value, ATPG,
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Low-Cost IP Core Test Using Tri-Template-Based Codes Gang ZENG Hideo ITO
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2007/01/01 Vol. E90-D No. 1 pp. 288-295 Type of Manuscript: PAPER Category: Dependable Computing Keyword: design for testability, IP core testing, test cost reduction, test data compression,
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Selective Low-Care Coding: A Means for Test Data Compression in Circuits with Multiple Scan Chains Youhua SHI Nozomu TOGAWA Shinji KIMURA Masao YANAGISAWA Tatsuo OHTSUKI
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2006/04/01 Vol. E89-A No. 4 pp. 996-1004 Type of Manuscript: Special Section PAPER (Special Section on Selected Papers from the 18th Workshop on Circuits and Systems in Karuizawa) Category: Keyword: test data compression, test channels, scan test,
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Concurrent Core Testing for SOC Using Merged Test Set and Scan Tree Gang ZENG Hideo ITO
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2006/03/01 Vol. E89-D No. 3 pp. 1157-1164 Type of Manuscript: PAPER Category: Dependable Computing Keyword: concurrent testing, SOC testing, test cost reduction, test data compression,
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X-Tolerant Test Data Compression for SOC with Enhanced Diagnosis Capability Gang ZENG Hideo ITO
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2005/07/01 Vol. E88-D No. 7 pp. 1662-1670 Type of Manuscript: PAPER Category: Dependable Computing Keyword: SOC testing, test cost reduction, test data compression, unknown state, test diagnosis,
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A Hybrid Dictionary Test Data Compression for Multiscan-Based Designs Youhua SHI Shinji KIMURA Masao YANAGISAWA Tatsuo OHTSUKI
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2004/12/01 Vol. E87-A No. 12 pp. 3193-3199 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Test Keyword: test data compression, test slice, multiple scan chain, ATE,
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A Selective Scan Chain Reconfiguration through Run-Length Coding for Test Data Compression and Scan Power Reduction Youhua SHI Shinji KIMURA Masao YANAGISAWA Tatsuo OHTSUKI
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2004/12/01 Vol. E87-A No. 12 pp. 3208-3215 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Test Keyword: test data compression, scan chain reconfiguration, run-length coding, scan-in power consumption,
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