Keyword : test compression


Reduction of Test Data Volume and Improvement of Diagnosability Using Hybrid Compression
Anis UZZAMAN Brion KELLER Brian FOUTZ Sandeep BHATIA Thomas BARTENSTEIN Masayuki ARAI Kazuhiko IWASAKI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2010/01/01
Vol. E93-D  No. 1 ; pp. 17-23
Type of Manuscript:  Special Section PAPER (Special Section on Test, Diagnosis and Verification of SOCs)
Category: 
Keyword: 
test compressionhybrid compressionvolume diagnosisATPGpartial good chip
 Summary | Full Text:PDF(390.7KB)

Test Compression for Robust Testable Path Delay Fault Testing Using Interleaving and Statistical Coding
Kazuteru NAMBA Hideo ITO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2009/02/01
Vol. E92-D  No. 2 ; pp. 269-282
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
test compressionstatistical codingrun-length codingdelay fault testingtwo-pattern testingscan testing
 Summary | Full Text:PDF(1.2MB)

An Architecture of Embedded Decompressor with Reconfigurability for Test Compression
Hideyuki ICHIHARA Tomoyuki SAIKI Tomoo INOUE 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/03/01
Vol. E91-D  No. 3 ; pp. 713-719
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSIs)
Category: Test Compression
Keyword: 
test compressionATEreconfigurabilityvariable-length codingtest application
 Summary | Full Text:PDF(408.7KB)

A Variable-Length Coding Adjustable for Compressed Test Application
Hideyuki ICHIHARA Toshihiro OHARA Michihiro SHINTANI Tomoo INOUE 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2007/08/01
Vol. E90-D  No. 8 ; pp. 1235-1242
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
test compressionvariable-length codingtest application timeATEHuffman codeand test environment
 Summary | Full Text:PDF(309.9KB)

Huffman-Based Test Response Coding
Hideyuki ICHIHARA Michihiro SHINTANI Tomoo INOUE 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2005/01/01
Vol. E88-D  No. 1 ; pp. 158-161
Type of Manuscript:  LETTER
Category: Dependable Computing
Keyword: 
Huffman codetest compressiontest responsetest application timeATE
 Summary | Full Text:PDF(103.9KB)

Don't Care Identification and Statistical Encoding for Test Data Compression
Seiji KAJIHARA Kenjiro TANIGUCHI Kohei MIYASE Irith POMERANZ Sudhakar M. REDDY 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2004/03/01
Vol. E87-D  No. 3 ; pp. 544-550
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSI)
Category: Test Generation and Compaction
Keyword: 
test compressiondon't care identificationHuffman's algorithmtest generation
 Summary | Full Text:PDF(377.8KB)

Test Generation for Test Compression Based on Statistical Coding
Hideyuki ICHIHARA Atsuhiro OGAWA Tomoo INOUE Akio TAMURA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2002/10/01
Vol. E85-D  No. 10 ; pp. 1466-1473
Type of Manuscript:  Special Section PAPER (Special Issue on Test and Verification of VLSI)
Category: Test Generation and Modification
Keyword: 
VLSI testtest compressionstatistical codetest generationautomatic test equipment
 Summary | Full Text:PDF(298.2KB)