Keyword : test channels


Selective Low-Care Coding: A Means for Test Data Compression in Circuits with Multiple Scan Chains
Youhua SHI Nozomu TOGAWA Shinji KIMURA Masao YANAGISAWA Tatsuo OHTSUKI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2006/04/01
Vol. E89-A  No. 4 ; pp. 996-1004
Type of Manuscript:  Special Section PAPER (Special Section on Selected Papers from the 18th Workshop on Circuits and Systems in Karuizawa)
Category: 
Keyword: 
test data compressiontest channelsscan test
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