Keyword : soft error


Minimization of Vote Operations for Soft Error Detection in DMR Design with Error Correction by Operation Re-Execution
Kazuhito ITO Yuto ISHIHARA Shinichi NISHIZAWA 
Publication:   
Publication Date: 2018/12/01
Vol. E101-A  No. 12 ; pp. 2271-2279
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: 
Keyword: 
soft errorerror detectionDMRcheckpointscheduling
 Summary | Full Text:PDF(1.3MB)

A Low Power Soft Error Hardened Latch with Schmitt-Trigger-Based C-Element
Saki TAJIMA Nozomu TOGAWA Masao YANAGISAWA Youhua SHI 
Publication:   
Publication Date: 2018/07/01
Vol. E101-A  No. 7 ; pp. 1025-1034
Type of Manuscript:  Special Section PAPER (Special Section on Design Methodologies for System on a Chip)
Category: 
Keyword: 
soft errorlow-powerlatchC-element
 Summary | Full Text:PDF(1.6MB)

A Low-Power Radiation-Hardened Flip-Flop with Stacked Transistors in a 65 nm FDSOI Process
Haruki MARUOKA Masashi HIFUMI Jun FURUTA Kazutoshi KOBAYASHI 
Publication:   
Publication Date: 2018/04/01
Vol. E101-C  No. 4 ; pp. 273-280
Type of Manuscript:  Special Section PAPER (Special Section on Solid-State Circuit Design — Architecture, Circuit, Device and Design Methodology)
Category: 
Keyword: 
single event effectsoft errorα particleneutronheavy ionFDSOIflip-floplow-power consumption
 Summary | Full Text:PDF(1.4MB)

Robustness Evaluation of Restricted Boltzmann Machine against Memory and Logic Error
Yasushi FUKUDA Zule XU Takayuki KAWAHARA 
Publication:   
Publication Date: 2017/12/01
Vol. E100-C  No. 12 ; pp. 1118-1121
Type of Manuscript:  BRIEF PAPER
Category: Integrated Electronics
Keyword: 
IoTneural networkRBMDBNsoft error
 Summary | Full Text:PDF(587.5KB)

A Self-Recoverable, Frequency-Aware and Cost-Effective Robust Latch Design for Nanoscale CMOS Technology
Aibin YAN Huaguo LIANG Zhengfeng HUANG Cuiyun JIANG Maoxiang YI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2015/12/01
Vol. E98-C  No. 12 ; pp. 1171-1178
Type of Manuscript:  PAPER
Category: Electronic Circuits
Keyword: 
transient faultsingle event upsetsoft errorradiation hardeningcircuit reliability
 Summary | Full Text:PDF(1.7MB)

Protection of On-chip Memory Systems against Multiple Cell Upsets Using Double-adjacent Error Correction Codes
Hoyoon JUN Yongsurk LEE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2015/03/01
Vol. E98-C  No. 3 ; pp. 267-274
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
soft errormultiple cell upsetserror correcting codeon-chip memories
 Summary | Full Text:PDF(761.7KB)

Reliability-Configurable Mixed-Grained Reconfigurable Array Supporting C-Based Design and Its Irradiation Testing
Hiroaki KONOURA Dawood ALNAJJAR Yukio MITSUYAMA Hajime SHIMADA Kazutoshi KOBAYASHI Hiroyuki KANBARA Hiroyuki OCHI Takashi IMAGAWA Kazutoshi WAKABAYASHI Masanori HASHIMOTO Takao ONOYE Hidetoshi ONODERA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2014/12/01
Vol. E97-A  No. 12 ; pp. 2518-2529
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: High-Level Synthesis and System-Level Design
Keyword: 
reconfigurable architecturesoft errorradiation testbehavioral synthesisstate machine
 Summary | Full Text:PDF(3.8MB)

SET Pulse-Width Measurement Suppressing Pulse-Width Modulation and Within-Die Process Variation Effects
Ryo HARADA Yukio MITSUYAMA Masanori HASHIMOTO Takao ONOYE 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2014/07/01
Vol. E97-A  No. 7 ; pp. 1461-1467
Type of Manuscript:  Special Section PAPER (Special Section on Design Methodologies for System on a Chip)
Category: 
Keyword: 
soft errorsingle event transient (SET)pulse-widthpulse-width modulationmeasurement circuitwithin-die process variation
 Summary | Full Text:PDF(1.8MB)

Analysis of Radiation-Induced Clock-Perturbation in Phase-Locked Loop
SinNyoung KIM Akira TSUCHIYA Hidetoshi ONODERA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2014/03/01
Vol. E97-A  No. 3 ; pp. 768-776
Type of Manuscript:  Special Section PAPER (Special Section on Analog Circuit Techniques and Related Topics)
Category: 
Keyword: 
radiation-hardened phase-locked loop (RH-PLL)soft errorclock-perturbation model
 Summary | Full Text:PDF(2.6MB)

A Cost-Effective Selective TMR for Coarse-Grained Reconfigurable Architectures Based on DFG-Level Vulnerability Analysis
Takashi IMAGAWA Hiroshi TSUTSUI Hiroyuki OCHI Takashi SATO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2013/04/01
Vol. E96-C  No. 4 ; pp. 454-462
Type of Manuscript:  Special Section PAPER (Special Section on Solid-State Circuit Design—Architecture, Circuit, Device and Design Methodology)
Category: 
Keyword: 
soft errorsingle event upsettriple modular redundancyreliabilitysimulated annealing
 Summary | Full Text:PDF(1.4MB)

A Radiation-Hard Redundant Flip-Flop to Suppress Multiple Cell Upset by Utilizing the Parasitic Bipolar Effect
Kuiyuan ZHANG Jun FURUTA Ryosuke YAMAMOTO Kazutoshi KOBAYASHI Hidetoshi ONODERA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2013/04/01
Vol. E96-C  No. 4 ; pp. 511-517
Type of Manuscript:  Special Section PAPER (Special Section on Solid-State Circuit Design—Architecture, Circuit, Device and Design Methodology)
Category: 
Keyword: 
DMRsoft errorMCUdevice simulation
 Summary | Full Text:PDF(2MB)

Multiple-Bit-Upset and Single-Bit-Upset Resilient 8T SRAM Bitcell Layout with Divided Wordline Structure
Shusuke YOSHIMOTO Takuro AMASHITA Shunsuke OKUMURA Hiroshi KAWAGUCHI Masahiko YOSHIMOTO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2012/10/01
Vol. E95-C  No. 10 ; pp. 1675-1681
Type of Manuscript:  PAPER
Category: Electronic Circuits
Keyword: 
SRAMsoft errormultiple-bit upset (MBU)single-event upset (SEU)error correction coding (ECC)alpha particleneutron particle
 Summary | Full Text:PDF(2.6MB)

Variation-Tolerance of a 65-nm Error-Hardened Dual-Modular-Redundancy Flip-Flop Measured by Shift-Register-Based Monitor Structures
Chikara HAMANAKA Ryosuke YAMAMOTO Jun FURUTA Kanto KUBOTA Kazutoshi KOBAYASHI Hidetoshi ONODERA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2011/12/01
Vol. E94-A  No. 12 ; pp. 2669-2675
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: High-Level Synthesis and System-Level Design
Keyword: 
soft errorhardened designvariabilitytest structureshift register
 Summary | Full Text:PDF(3.1MB)

A Dynamic Continuous Signature Monitoring Technique for Reliable Microprocessors
Makoto SUGIHARA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/04/01
Vol. E94-C  No. 4 ; pp. 477-486
Type of Manuscript:  Special Section PAPER (Special Section on Circuits and Design Techniques for Advanced Large Scale Integration)
Category: 
Keyword: 
soft errorNBTISEUSETcontrol signal errorcontinuous signature monitoringreliabilityvulnerabilitymicroprocessor
 Summary | Full Text:PDF(485.3KB)

Single-Event-Upset Tolerant RS Flip-Flop with Small Area
Kazuteru NAMBA Kengo NAKASHIMA Hideo ITO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2010/12/01
Vol. E93-D  No. 12 ; pp. 3407-3409
Type of Manuscript:  LETTER
Category: Dependable Computing
Keyword: 
soft errorsingle-event-upset (SEU) tolerancereset-set flip-flop (RS-FF)interlocking feedback loop
 Summary | Full Text:PDF(240.1KB)

Measurement Circuits for Acquiring SET Pulse Width Distribution with Sub-FO1-Inverter-Delay Resolution
Ryo HARADA Yukio MITSUYAMA Masanori HASHIMOTO Takao ONOYE 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2010/12/01
Vol. E93-A  No. 12 ; pp. 2417-2423
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Device and Circuit Modeling and Analysis
Keyword: 
soft errorsingle event transient (SET)pulse widthmeasurement circuit
 Summary | Full Text:PDF(675KB)

On Synthesizing a Reliable Multiprocessor for Embedded Systems
Makoto SUGIHARA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2010/12/01
Vol. E93-A  No. 12 ; pp. 2560-2569
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: High-Level Synthesis and System-Level Design
Keyword: 
heterogeneous multiprocessor synthesissoft errorsingle event upsetreliabilityreal-time system
 Summary | Full Text:PDF(506.4KB)

Reliability Evaluation Environment for Exploring Design Space of Coarse-Grained Reconfigurable Architectures
Takashi IMAGAWA Masayuki HIROMOTO Hiroyuki OCHI Takashi SATO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2010/12/01
Vol. E93-A  No. 12 ; pp. 2524-2532
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: High-Level Synthesis and System-Level Design
Keyword: 
soft errorTMRreliabilitymethodology
 Summary | Full Text:PDF(653KB)

Construction of Soft-Error-Tolerant FF with Wide Error Pulse Detecting Capability
Shuangyu RUAN Kazuteru NAMBA Hideo ITO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2009/08/01
Vol. E92-D  No. 8 ; pp. 1534-1541
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
soft errorwide pulseflip-flopC-elementdelay element
 Summary | Full Text:PDF(466.7KB)

Reliability Inherent in Heterogeneous Multiprocessor Systems and Task Scheduling for Ameliorating Their Reliability
Makoto SUGIHARA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2009/04/01
Vol. E92-A  No. 4 ; pp. 1121-1128
Type of Manuscript:  Special Section PAPER (Special Section on Advanced Technologies Emerging Mainly from the 21st Workshop on Circuits and Systems in Karuizawa)
Category: 
Keyword: 
soft errorsingle event upsetreliabilitytask schedulingheterogeneous multiprocessor systems
 Summary | Full Text:PDF(337.4KB)

Autonomous Repair Fault Tolerant Dynamic Reconfigurable Device
Kentaro NAKAHARA Shin'ichi KOUYAMA Tomonori IZUMI Hiroyuki OCHI Yukihiro NAKAMURA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2008/12/01
Vol. E91-A  No. 12 ; pp. 3612-3621
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Embedded, Real-Time and Reconfigurable Systems
Keyword: 
fault tolerancedependableFPGAreconfigurable devicesoft error
 Summary | Full Text:PDF(633.8KB)

Adopting the Drowsy Technique for Instruction Caches: A Soft Error Perspective
Soong Hyun SHIN Sung Woo CHUNG Eui-Young CHUNG Chu Shik JHON 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2008/07/01
Vol. E91-A  No. 7 ; pp. 1772-1779
Type of Manuscript:  PAPER
Category: VLSI Design Technology and CAD
Keyword: 
instruction cachesoft errordrowsy techniquelow-power
 Summary | Full Text:PDF(353.3KB)

Architectural-Level Soft-Error Modeling for Estimating Reliability of Computer Systems
Makoto SUGIHARA Tohru ISHIHARA Kazuaki MURAKAMI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2007/10/01
Vol. E90-C  No. 10 ; pp. 1983-1991
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Technology toward Frontiers of New Market)
Category: VLSI Design Technology
Keyword: 
soft errorreliabilityestimationcomputer systemsinstruction-set simulation
 Summary | Full Text:PDF(670.7KB)

A Reliability-Enhanced TCAM Architecture with Associated Embedded DRAM and ECC
Hideyuki NODA Katsumi DOSAKA Hans Jurgen MATTAUSCH Tetsushi KOIDE Fukashi MORISHITA Kazutami ARIMOTO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2006/11/01
Vol. E89-C  No. 11 ; pp. 1612-1619
Type of Manuscript:  Special Section PAPER (Special Section on Novel Device Architectures and System Integration Technologies)
Category: 
Keyword: 
soft errorECCTCAMembeddedDRAM
 Summary | Full Text:PDF(1.2MB)

New α-Particle Induced Soft Error Mechanism in a Three Dimensional Capacitor Cell
Yukihito OOWAKI Keiji MABUCHI Shigeyoshi WATANABE Kazunori OHUCHI Jun'ichi MATSUNAGA Fujio MASUOKA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1995/07/25
Vol. E78-C  No. 7 ; pp. 845-851
Type of Manuscript:  Special Section PAPER (Special Issue on LSI Memory Device, Circuit, Architecture and Application Technologies for Multimedia Age)
Category: 
Keyword: 
α-particlesoft errorDRAM
 Summary | Full Text:PDF(605.2KB)

Minority Carrier Collection in 256 M-bit DRAM Cell on Incidence of Alpha-Particle Analyzed by Three-Dimensional Device Simulation
Sumiko OSHIDA Masao TAGUCHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1993/11/25
Vol. E76-C  No. 11 ; pp. 1604-1610
Type of Manuscript:  Special Section PAPER (Special Issue on LSI Memories)
Category: DRAM
Keyword: 
soft errordevice simulation256 M-bit DRAM
 Summary | Full Text:PDF(527.8KB)

Soft-Error Immune 180-µm2 SICOS Upward Transistor Memory Cell for Ultra-High-Speed High-Density Bipolar RAMs
Youji IDEI Takeo SHIBA Noriyuki HOMMA Kunihiko YAMAGUCHI Tohru NAKAMURA Takahiro ONAI Youichi TAMAKI Yoshiaki SAKURAI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1992/11/25
Vol. E75-C  No. 11 ; pp. 1369-1376
Type of Manuscript:  Special Section PAPER (Special Issue on LSI Memories)
Category: 
Keyword: 
soft errorSICOSbipolar RAM256 Kbit
 Summary | Full Text:PDF(765.4KB)