Keyword : single event effect


A Low-Power Radiation-Hardened Flip-Flop with Stacked Transistors in a 65 nm FDSOI Process
Haruki MARUOKA Masashi HIFUMI Jun FURUTA Kazutoshi KOBAYASHI 
Publication:   
Publication Date: 2018/04/01
Vol. E101-C  No. 4 ; pp. 273-280
Type of Manuscript:  Special Section PAPER (Special Section on Solid-State Circuit Design — Architecture, Circuit, Device and Design Methodology)
Category: 
Keyword: 
single event effectsoft errorα particleneutronheavy ionFDSOIflip-floplow-power consumption
 Summary | Full Text:PDF(1.4MB)

Error Propagation Analysis for Single Event Upset considering Masking Effects on Re-Convergent Path
Go MATSUKAWA Yuta KIMI Shuhei YOSHIDA Shintaro IZUMI Hiroshi KAWAGUCHI Masahiko YOSHIMOTO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2016/06/01
Vol. E99-A  No. 6 ; pp. 1198-1205
Type of Manuscript:  PAPER
Category: VLSI Design Technology and CAD
Keyword: 
single event effectsingle event upsetsoft error propagationlogical maskingtemporal masking
 Summary | Full Text:PDF(1.7MB)

A Fundamental Analysis of Single Event Effects on Clocked CVSL Circuits with Gated Feedback
Hiroshi HATANO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/06/01
Vol. E94-C  No. 6 ; pp. 1131-1134
Type of Manuscript:  BRIEF PAPER
Category: Semiconductor Materials and Devices
Keyword: 
cascade voltage switch logicsingle event effectexclusive-ORradiationsimulation
 Summary | Full Text:PDF(498.9KB)

A Single Event Effect Analysis on Static CVSL Exclusive-OR Circuits
Hiroshi HATANO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/09/01
Vol. E93-C  No. 9 ; pp. 1471-1473
Type of Manuscript:  BRIEF PAPER
Category: Semiconductor Materials and Devices
Keyword: 
cascade voltage switch logicsingle event effectexclusive-ORradiationsimulation
 Summary | Full Text:PDF(311.2KB)