Keyword : semiconductor


Automatic Defect Classification System in Semiconductors EDS Test Based on System Entity Structure Methodology
Young-Shin HAN  SoYoung KIM  TaeKyu KIM  Jason J. JUNG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2010/07/01
Vol. E93-D  No. 7  pp. 2001-2004
Type of Manuscript: LETTER
Category: Artificial Intelligence, Data Mining
Keyword: 
semiconductorsystem entity structureelectrical die sortingfail bit map datapruning
  Summary |  Full Text:PDF (348.1KB)

Design of Gear-Form Cathode as a Removal Modusof Optical Materials of Indium-Tin-Oxide
Pai-Shan PA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2009/11/01
Vol. E92-C  No. 11  pp. 1358-1361
Type of Manuscript: BRIEF PAPER
Category: 
Keyword: 
gear-form cathodeIndium-Tin-Oxidesemiconductornanostructure crystallization
  Summary |  Full Text:PDF (533.8KB)

Low Driving Voltage 40 Gbit/s n-i-n Mach-Zehnder Modulator Fabricated on InP Substrate
Ken TSUZUKI  Tadao ISHIBASHI  Hiroshi YASAKA  Yuichi TOHMORI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/05/01
Vol. E88-C  No. 5  pp. 960-966
Type of Manuscript: Special Section PAPER (Joint Special Section on Recent Progress in Optoelectronics and Communications)
Category: Optical Active Devices and Modules
Keyword: 
Mach-ZehndermodulatorInPn-i-nsemiconductor
  Summary |  Full Text:PDF (608.9KB)

Design and Development of 3-Dimensional Process Simulator
Tetsunori WADA  Norihiko KOTANI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/06/20
Vol. E82-C  No. 6  pp. 839-847
Type of Manuscript: INVITED PAPER (Special Issue on TCAD for Semiconductor Industries)
Category: 
Keyword: 
semiconductorprocess simulatordesignfile format
  Summary |  Full Text:PDF (1.8MB)

Mechanical Stress Simulation for Highly Reliable Deep-Submicron Devices
Hideo MIURA  Shuji IKEDA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/06/20
Vol. E82-C  No. 6  pp. 830-838
Type of Manuscript: INVITED PAPER (Special Issue on TCAD for Semiconductor Industries)
Category: 
Keyword: 
semiconductortransistorresidual stressstress analysisstress measurement
  Summary |  Full Text:PDF (640.2KB)

Gb/s-Range Semiconductor and Ti:LiNbO3 Guided-Wave Optical Modulators.
Keiro KOMATSU  Rangaraj MADABHUSHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/01/20
Vol. E79-C  No. 1  pp. 3-13
Type of Manuscript: INVITED PAPER (Special Issue on Optomicrowave Techniques and Their Applications)
Category: Optomicrowave Devices
Keyword: 
optical modulatorswaveguidesemiconductorLinbO3optical communication systems
  Summary |  Full Text:PDF (1MB)

Defect Detection of Passivation Layer by a Bias-Free Cu Decoration Method
Tetsuaki WADA  Shinji NAKANO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/04/20
Vol. E77-C  No. 4  pp. 585-589
Type of Manuscript: Special Section PAPER (Special Issue on LSI Failure Analysis)
Category: 
Keyword: 
semiconductorpassivationdefectreliabilityhumidity test
  Summary |  Full Text:PDF (976.6KB)

Barrier Metal Effect on Electro- and Stress-Migration
Tetsuaki WADA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1994/01/20
Vol. E77-A  No. 1  pp. 180-186
Type of Manuscript: Special Section PAPER (Special Section on Reliability)
Category: Failure Physics and Failure Analysis
Keyword: 
semiconductormetalbarrier metalreliability electromigrationstress-migration
  Summary |  Full Text:PDF (1MB)

Multiple-Phase-Shift Super Structure Grating DBR Lasers
Hiroyuki ISHII  Yuichi TOHMORI  Fumiyoshi KANO  Yuzo YOSHIKUNI  Yasuhiro KONDO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1993/11/20
Vol. E76-C  No. 11  pp. 1683-1690
Type of Manuscript: PAPER
Category: Opto-Electronics
Keyword: 
semiconductorlaser diodedistributed Bragg reflectorwavelength tuning
  Summary |  Full Text:PDF (788KB)

Design of Ultrawide-Band, High-Sensitivity p-i-n Protodetectors
Kazutoshi KATO  Susumu HATA  Kenji KAWANO  Atsuo KOZEN 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1993/02/20
Vol. E76-C  No. 2  pp. 214-221
Type of Manuscript: Special Section PAPER (Special Issue on Optical/Microwave Interaction Devices, Circuits and Systems)
Category: Optical/Microwave Devices
Keyword: 
p-i-n photodetectorsemiconductormicrowavemultimode waveguide
  Summary |  Full Text:PDF (696.4KB)

Semiconductor Optical Modulator by Using Electron Depleting Absorption Control
Minoru YAMADA  Kazuhiro NODA  Yuji KUWAMURA  Hirohumi NAKANISHI  Kiyohumi IMAI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1992/09/20
Vol. E75-C  No. 9  pp. 1063-1070
Type of Manuscript: PAPER
Category: Opto-Electronics
Keyword: 
optical modulatoroptical switchsemiconductor
  Summary |  Full Text:PDF (600.7KB)

Contamination Control in Low-Pressure Process Equipment
Koichi TSUZUKI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1992/07/20
Vol. E75-C  No. 7  pp. 860-865
Type of Manuscript: Special Section PAPER (Special Issue on Ultra Clean Technology)
Category: 
Keyword: 
particulate contaminationsemiconductorlow-pressure processingparticle dynamics
  Summary |  Full Text:PDF (457.4KB)