Keyword : seed

A Single Input Change Test Pattern Generator for Sequential Circuits
Feng LIANG  ShaoChong LEI  ZhiBiao SHAO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/08/01
Vol. E91-C  No. 8  pp. 1365-1370
Type of Manuscript: PAPER
Category: Semiconductor Materials and Devices
Keyword: 
built-in self-test (BIST),  single input change (SIC) sequence,  seed,  sequential circuit, 
  Summary |  Full Text:PDF (340.7KB)
Seed Selection Procedure for LFSR-Based Random Pattern Generators
Kenichi ICHINO  Ko-ichi WATANABE  Masayuki ARAI  Satoshi FUKUMOTO  Kazuhiko IWASAKI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2003/12/01
Vol. E86-A  No. 12  pp. 3063-3071
Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Timing Verification and Test Generation
Keyword: 
BIST,  LFSR,  test-per-clock,  test-per-scan,  seed,  polynomial, 
  Summary |  Full Text:PDF (672KB)