Keyword : scan test


Complex Networks Clustering for Lower Power Scan Segmentation in At-Speed Testing
Zhou JIANG Guiming LUO Kele SHEN 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2016/09/01
Vol. E99-C  No. 9 ; pp. 1071-1079
Type of Manuscript:  PAPER
Category: Electronic Circuits
Keyword: 
scan testscan segmentationlower power testingcomplex networks clusteringdesign for testabilityat-speed testing
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X-Handling for Current X-Tolerant Compactors with More Unknowns and Maximal Compaction
Youhua SHI Nozomu TOGAWA Masao YANAGISAWA Tatsuo OHTSUKI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2009/12/01
Vol. E92-A  No. 12 ; pp. 3119-3127
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Logic Synthesis, Test and Verfication
Keyword: 
scan testtest data compressionX-masking
 Summary | Full Text:PDF(851.7KB)

A Unified Test Compression Technique for Scan Stimulus and Unknown Masking Data with No Test Loss
Youhua SHI Nozomu TOGAWA Masao YANAGISAWA Tatsuo OHTSUKI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2008/12/01
Vol. E91-A  No. 12 ; pp. 3514-3523
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Logic Synthesis, Test and Verification
Keyword: 
scan testtest data compressionX-masking
 Summary | Full Text:PDF(583.3KB)

A Secure Test Technique for Pipelined Advanced Encryption Standard
Youhua SHI Nozomu TOGAWA Masao YANAGISAWA Tatsuo OHTSUKI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/03/01
Vol. E91-D  No. 3 ; pp. 776-780
Type of Manuscript:  Special Section LETTER (Special Section on Test and Verification of VLSIs)
Category: 
Keyword: 
scan testsecuritytest quality
 Summary | Full Text:PDF(145.8KB)

Selective Low-Care Coding: A Means for Test Data Compression in Circuits with Multiple Scan Chains
Youhua SHI Nozomu TOGAWA Shinji KIMURA Masao YANAGISAWA Tatsuo OHTSUKI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2006/04/01
Vol. E89-A  No. 4 ; pp. 996-1004
Type of Manuscript:  Special Section PAPER (Special Section on Selected Papers from the 18th Workshop on Circuits and Systems in Karuizawa)
Category: 
Keyword: 
test data compressiontest channelsscan test
 Summary | Full Text:PDF(445.2KB)

A New Solution to Power Supply Voltage Drop Problems in Scan Testing
Takaki YOSHIDA Masafumi WATARI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2004/03/01
Vol. E87-D  No. 3 ; pp. 580-585
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSI)
Category: Scan Testing
Keyword: 
power supply voltage dropnoiselow powerscan testclock duty
 Summary | Full Text:PDF(923.9KB)