Keyword : scan chain reconfiguration


A Selective Scan Chain Reconfiguration through Run-Length Coding for Test Data Compression and Scan Power Reduction
Youhua SHI Shinji KIMURA Masao YANAGISAWA Tatsuo OHTSUKI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2004/12/01
Vol. E87-A  No. 12 ; pp. 3208-3215
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Test
Keyword: 
test data compressionscan chain reconfigurationrun-length codingscan-in power consumption
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