Keyword : reseeding


Application of High Quality Built-in Test Using Neighborhood Pattern Generator to Industrial Designs
Kazumi HATAYAMA Michinobu NAKAO Yoshikazu KIYOSHIGE Koichiro NATSUME Yasuo SATO Takaharu NAGUMO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2004/12/01
Vol. E87-A  No. 12 ; pp. 3318-3323
Type of Manuscript:  Special Section LETTER (Special Section on VLSI Design and CAD Algorithms)
Category: Test
Keyword: 
BISTtest pattern generatorneighborhood patternLFSRreseeding
 Summary | Full Text:PDF(429.3KB)

A Built-in Reseeding Technique for LFSR-Based Test Pattern Generation
Youhua SHI Zhe ZHANG Shinji KIMURA Masao YANAGISAWA Tatsuo OHTSUKI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2003/12/01
Vol. E86-A  No. 12 ; pp. 3056-3062
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Timing Verification and Test Generation
Keyword: 
reseedingLFSRBISTtest pattern generation
 Summary | Full Text:PDF(1MB)

Deterministic Built-in Test with Neighborhood Pattern Generator
Michinobu NAKAO Yoshikazu KIYOSHIGE Koichiro NATSUME Kazumi HATAYAMA Satoshi FUKUMOTO Kazuhiko IWASAKI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2002/05/01
Vol. E85-D  No. 5 ; pp. 874-883
Type of Manuscript:  PAPER
Category: Fault Tolerance
Keyword: 
BISTtest pattern generatorreseedingbit-flippingseed generation
 Summary | Full Text:PDF(839.2KB)