IEICE SEARCH SYSTEM

Keyword : reliability

Effects of Fluorine Implantation on 1/f Noise, Hot Carrier and NBTI Reliability of MOSFETs Jae-Hyung JANG Hyuk-Min KWON Ho-Young KWAK Sung-Kyu KWON Seon-Man HWANG Jong-Kwan SHIN Seung-Yong SUNG Yi-Sun CHUNG Da-Soon LEE Hi-Deok LEE
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2013/05/01 Vol. E96-C No. 5 pp. 624-629 Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices) Category: Keyword: fluorine, flicker noise, 1/f noise, reliability, hot-carrier, NBTI, MOSFET,
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Self Synchronous Circuits for Robust Operation in Low Voltage and Soft Error Prone Environments Benjamin DEVLIN Makoto IKEDA Kunihiro ASADA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2013/04/01 Vol. E96-C No. 4 pp. 518-527 Type of Manuscript: Special Section PAPER (Special Section on Solid-State Circuit Design—Architecture, Circuit, Device and Design Methodology) Category: Keyword: self synchronous, gate-level, robustness, single event upset, low voltage, reliability,
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A Cost-Effective Selective TMR for Coarse-Grained Reconfigurable Architectures Based on DFG-Level Vulnerability Analysis Takashi IMAGAWA Hiroshi TSUTSUI Hiroyuki OCHI Takashi SATO
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2013/04/01 Vol. E96-C No. 4 pp. 454-462 Type of Manuscript: Special Section PAPER (Special Section on Solid-State Circuit Design—Architecture, Circuit, Device and Design Methodology) Category: Keyword: soft error, single event upset, triple modular redundancy, reliability, simulated annealing,
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Solution-Processed Photosensitive Passivation Layer for an a-Si TFT for LCDs with a Low Dielectric Constant Akihiro TANABE Masahiro HANMURA Takeyoshi KATOH Hironori OOMORI Akira HONMA Teruhiko SUZUKI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2012/11/01 Vol. E95-C No. 11 pp. 1737-1743 Type of Manuscript: Special Section PAPER (Special Section on Electronic Displays) Category: INVITED Keyword: passivation, a-Si, solution-processed, reliability,
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BTRB: Beam Table-Based Reliable Broadcast for Directional Antennas Laihyuk PARK Jeongseok YU Chan-Gun LEE Sungrae CHO
Publication: IEICE TRANSACTIONS on Communications Publication Date: 2012/10/01 Vol. E95-B No. 10 pp. 3307-3311 Type of Manuscript: LETTER Category: Network Keyword: directional MAC, reliability, broadcast, ACK combination,
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Impact of Discrete-Charge-Induced Variability on Scaled MOS Devices Kiyoshi TAKEUCHI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2012/04/01 Vol. E95-C No. 4 pp. 414-420 Type of Manuscript: Special Section PAPER (Special Section on Solid-State Circuit Design – Architecture, Circuit, Device and Design Methodology) Category: INVITED Keyword: variability, reliability, random dopant fluctuation, random telegraph noise,
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Smart Power Supply Systems for Mission Critical Facilities Keiichi HIROSE Tadatoshi BABASAKI
Publication: IEICE TRANSACTIONS on Communications Publication Date: 2012/03/01 Vol. E95-B No. 3 pp. 755-772 Type of Manuscript: SURVEY PAPER Category: INVITED Keyword: electirc power, power quality, reliability, micro grid, smart grid, DC power, mission critical facilities,
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Effects of Reliability Measures on Market Share Masahiro HAYASHI
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2011/10/01 Vol. E94-A No. 10 pp. 2043-2047 Type of Manuscript: LETTER Category: Reliability, Maintainability and Safety Analysis Keyword: reliability, availability, failure frequency, market share,
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Shaka: User Movement Estimation Considering Reliability, Power Saving, and Latency Using Mobile Phone Arei KOBAYASHI Shigeki MURAMATSU Daisuke KAMISAKA Takafumi WATANABE Atsunori MINAMIKAWA Takeshi IWAMOTO Hiroyuki YOKOYAMA
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2011/06/01 Vol. E94-D No. 6 pp. 1153-1163 Type of Manuscript: Special Section PAPER (Special Section on Emerging Technologies of Ubiquitous Computing Systems) Category: Keyword: activity recognition, accelerometer, microphone, GPS, reliability, power saving, latency,
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A Dynamic Continuous Signature Monitoring Technique for Reliable Microprocessors Makoto SUGIHARA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2011/04/01 Vol. E94-C No. 4 pp. 477-486 Type of Manuscript: Special Section PAPER (Special Section on Circuits and Design Techniques for Advanced Large Scale Integration) Category: Keyword: soft error, NBTI, SEU, SET, control signal error, continuous signature monitoring, reliability, vulnerability, microprocessor,
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Prediction of Circuit-Performance Variations from Technology Variations for Reliable 100 nm SOC Circuit Design Norio SADACHIKA Shu MIMURA Akihiro YUMISAKI Kou JOHGUCHI Akihiro KAYA Mitiko MIURA-MATTAUSCH Hans Jurgen MATTAUSCH
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2011/03/01 Vol. E94-C No. 3 pp. 361-367 Type of Manuscript: PAPER Category: Semiconductor Materials and Devices Keyword: circuit simulation, compact model, DFM, reliability,
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Reliability Evaluation Environment for Exploring Design Space of Coarse-Grained Reconfigurable Architectures Takashi IMAGAWA Masayuki HIROMOTO Hiroyuki OCHI Takashi SATO
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2010/12/01 Vol. E93-A No. 12 pp. 2524-2532 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: High-Level Synthesis and System-Level Design Keyword: soft error, TMR, reliability, methodology,
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Dual Evanescently Coupled Waveguide Photodiodes with High Reliability for over 40-Gbps Optical Communication Systems Kazuhiro SHIBA Yasuyuki SUZUKI Sawaki WATANABE Tadayuki CHIKUMA Takeshi TAKEUCHI Kikuo MAKITA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2010/12/01 Vol. E93-C No. 12 pp. 1655-1661 Type of Manuscript: PAPER Category: Lasers, Quantum Electronics Keyword: 100-Gbps, 40-Gbps, differential phase shift-keying (DPSK), reliability, waveguide photodiode,
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On Synthesizing a Reliable Multiprocessor for Embedded Systems Makoto SUGIHARA
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2010/12/01 Vol. E93-A No. 12 pp. 2560-2569 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: High-Level Synthesis and System-Level Design Keyword: heterogeneous multiprocessor synthesis, soft error, single event upset, reliability, real-time system,
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Highly Reliable and Drivability-Enhanced MOS Transistors with Rounded Nanograting Channels Takashi ITO Xiaoli ZHU Shin-Ichiro KUROKI Koji KOTANI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2010/11/01 Vol. E93-C No. 11 pp. 1638-1644 Type of Manuscript: PAPER Category: Semiconductor Materials and Devices Keyword: nanograting, current drive, effective mobility, reliability, TDDB, NBTI,
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Highly Reliable PON Optical Splitters for Optical Access Networks in Outside Environments Hiroshi WATANABE Noriyuki ARAKI Hisashi FUJIMOTO
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2010/07/01 Vol. E93-C No. 7 pp. 1180-1190 Type of Manuscript: Special Section PAPER (Special Section on Photonic Technologies for Access Networks) Category: Keyword: optical splitter, reliability, outside environment, PON, PLC,
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Design and Implementation of Hybrid MAC-Based Robust Architecture for Wireless Sensor Network Taeshik SHON Eui-jik KIM Jeongsik IN Yongsuk PARK
Publication: IEICE TRANSACTIONS on Communications Publication Date: 2010/04/01 Vol. E93-B No. 4 pp. 1016-1019 Type of Manuscript: LETTER Category: Network Keyword: IEEE 802.15.4, security, energy consumption, reliability, wireless sensor network,
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The Software Reliability Model Based on Fractals Yong CAO Qingxin ZHU
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2010/02/01 Vol. E93-D No. 2 pp. 376-379 Type of Manuscript: LETTER Category: Software Engineering Keyword: reliability, fractals, prediction, software failure,
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Practical Redundant-Via Insertion Method Considering Manufacturing Variability and Reliability Yuji TAKASHIMA Kazuyuki OOYA Atsushi KUROKAWA
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2009/12/01 Vol. E92-A No. 12 pp. 2962-2970 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Physical Level Desing Keyword: redundant via, manufacturing variability, reliability,
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Fiber Access Networks: Reliability Analysis and Swedish Broadband Market Lena WOSINSKA Jiajia CHEN Claus Popp LARSEN
Publication: IEICE TRANSACTIONS on Communications Publication Date: 2009/10/01 Vol. E92-B No. 10 pp. 3006-3014 Type of Manuscript: Special Section PAPER (Special Section on Advanced Information and Communication Technologies and Services in Conjunction with Main Topics of APCC/COIN 2008) Category: INVITED Keyword: optical fiber LAN, protection, reliability, capital expenditures (CAPEX), operational expenditures (OPEX), fiber-to-the-home (FTTH), passive optical network (PON), active optical network (AON),
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Empirical-Statistics Analysis for Zero-Failure GaAs MMICs Life Testing Data Zheng-Liang HUANG Fa-Xin YU Shu-Ting ZHANG Hao LUO Ping-Hui WANG Yao ZHENG
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2009/09/01 Vol. E92-A No. 9 pp. 2376-2379 Type of Manuscript: LETTER Category: Reliability, Maintainability and Safety Analysis Keyword: MMICs, reliability, failure, accelerated testing, Weibull distribution, lognormal distribution,
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Temperature-Aware NBTI Modeling Techniques in Digital Circuits Hong LUO Yu WANG Rong LUO Huazhong YANG Yuan XIE
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2009/06/01 Vol. E92-C No. 6 pp. 875-886 Type of Manuscript: PAPER Category: Integrated Electronics Keyword: negative bias temperature instability (NBTI), temperature, reliability,
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Reliability Inherent in Heterogeneous Multiprocessor Systems and Task Scheduling for Ameliorating Their Reliability Makoto SUGIHARA
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2009/04/01 Vol. E92-A No. 4 pp. 1121-1128 Type of Manuscript: Special Section PAPER (Special Section on Advanced Technologies Emerging Mainly from the 21st Workshop on Circuits and Systems in Karuizawa) Category: Keyword: soft error, single event upset, reliability, task scheduling, heterogeneous multiprocessor systems,
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CRRT: Congestion-Aware and Rate-Controlled Reliable Transport in Wireless Sensor Networks Muhammad Mahbub ALAM Choong Seon HONG
Publication: IEICE TRANSACTIONS on Communications Publication Date: 2009/01/01 Vol. E92-B No. 1 pp. 184-199 Type of Manuscript: PAPER Category: Network Keyword: congestion control, rate control, reliability, fairness, wireless sensor networks,
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Design Methodology of a Sensor Network Architecture Supporting Urgent Information and Its Evaluation Tetsuya KAWAI Naoki WAKAMIYA Masayuki MURATA
Publication: IEICE TRANSACTIONS on Communications Publication Date: 2008/10/01 Vol. E91-B No. 10 pp. 3232-3240 Type of Manuscript: PAPER Category: Network Keyword: sensor networks, urgent information, latency, reliability,
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Highly Reliable Submicron InP-Based HBTs with over 300-GHz f_t Norihide KASHIO Kenji KURISHIMA Yoshino K. FUKAI Shoji YAMAHATA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2008/07/01 Vol. E91-C No. 7 pp. 1084-1090 Type of Manuscript: Special Section PAPER (Special Section on Heterostructure Microelectronics with TWHM 2007) Category: GaAs- and InP-Based Devices Keyword: InP HBTs, passivation ledge, reliability,
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Reliable Cache Architectures and Task Scheduling for Multiprocessor Systems Makoto SUGIHARA Tohru ISHIHARA Kazuaki MURAKAMI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2008/04/01 Vol. E91-C No. 4 pp. 410-417 Type of Manuscript: Special Section PAPER (Special Section on Advanced Technologies in Digital LSIs and Memories) Category: Keyword: single event upset, SRAM, DRAM, reliability, cache architecture, task scheduling,
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Proposal of an Assured Corridor Mechanism for Urgent Information Transmission in Wireless Sensor Networks Tetsuya KAWAI Naoki WAKAMIYA Masayuki MURATA
Publication: IEICE TRANSACTIONS on Communications Publication Date: 2007/10/01 Vol. E90-B No. 10 pp. 2817-2826 Type of Manuscript: PAPER Category: Network Keyword: sensor networks, urgent information, fastness, reliability,
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Architectural-Level Soft-Error Modeling for Estimating Reliability of Computer Systems Makoto SUGIHARA Tohru ISHIHARA Kazuaki MURAKAMI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2007/10/01 Vol. E90-C No. 10 pp. 1983-1991 Type of Manuscript: Special Section PAPER (Special Section on VLSI Technology toward Frontiers of New Market) Category: VLSI Design Technology Keyword: soft error, reliability, estimation, computer systems, instruction-set simulation,
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A Test Structure to Analyze Electrical CMOSFET Reliabilities between Center and Edge along the Channel Width Takashi OHZONE Eiji ISHII Takayuki MORISHITA Kiyotaka KOMOKU Toshihiro MATSUDA Hideyuki IWATA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2007/02/01 Vol. E90-C No. 2 pp. 515-522 Type of Manuscript: PAPER Category: Semiconductor Materials and Devices Keyword: CMOSFET, reliability, LDD-type, channel width, isolation,
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Reliable Parallel File System with Parity Cache Table Support Sheng-Kai HUNG Yarsun HSU
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2007/01/01 Vol. E90-D No. 1 pp. 22-29 Type of Manuscript: Special Section PAPER (Special Section on Parallel/Distributed Processing and Systems) Category: Parallel Processing System Keyword: cluster, reliability, parallel virtual file system, redundant array of independent disks, parity cache table,
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Fast Algorithm for Generating Candidate Codewords in Reliability-Based Maximum Likelihood Decoding Hideki YAGI Toshiyasu MATSUSHIMA Shigeichi HIRASAWA
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2006/10/01 Vol. E89-A No. 10 pp. 2676-2683 Type of Manuscript: Special Section LETTER (Special Section on Information Theory and Its Applications) Category: Coding Theory Keyword: maximum likelihood decoding, binary block codes, priority-first search, most reliable basis, reliability,
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A Rate Adaptive Multicast Protocol for Providing MAC Layer Reliability in WLANs Anas BASALAMAH Hiroki SUGIMOTO Takuro SATO
Publication: IEICE TRANSACTIONS on Communications Publication Date: 2006/10/01 Vol. E89-B No. 10 pp. 2733-2740 Type of Manuscript: Special Section PAPER (Special Section on Mobile Multimedia Communications) Category: Keyword: WLAN, reliability, rate adaptation, multicast,
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Analytical Model on Hybrid State Saving with a Limited Number of Checkpoints and Bound Rollbacks Mamoru OHARA Ryo SUZUKI Masayuki ARAI Satoshi FUKUMOTO Kazuhiko IWASAKI
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2006/09/01 Vol. E89-A No. 9 pp. 2386-2395 Type of Manuscript: PAPER Category: Reliability, Maintainability and Safety Analysis Keyword: reliability, distributed systems, hybrid state saving Time Warp simulation, evaluation model,
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Reliability of a 2-Dimensional Lattice System Subject to Dependent Component Failure Tetsushi YUGE Shigeru YANAGI
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2006/08/01 Vol. E89-A No. 8 pp. 2192-2197 Type of Manuscript: PAPER Category: Reliability, Maintainability and Safety Analysis Keyword: 2-dimensional lattice system, dependent failure, reliability, spare,
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Research on the Tolerance Distribution of Sealed Electromagnetic Relay with Reliability Index Huimin LIANG Xuerong YE Guofu ZHAI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2006/08/01 Vol. E89-C No. 8 pp. 1164-1172 Type of Manuscript: Special Section PAPER (Special Section on Recent Development of Electromechanical Devices (Selected Papers from IS-EMD2005)) Category: Relays & Switches Keyword: sealed electromagnetic relay, tolerance distribution, tolerance band, reliability,
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Effects of Rapid Thermal Annealing on Bias-Stress-Induced Base Leakage in InGaP/GaAs Collector-Up Heterojunction Bipolar Transistors Fabricated with B Ion Implantation Kazuhiro MOCHIZUKI Ken-ichi TANAKA Takashi SHIOTA Takafumi TANIGUCHI Hiroyuki UCHIYAMA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2006/07/01 Vol. E89-C No. 7 pp. 943-948 Type of Manuscript: Special Section PAPER (Special Section on Heterostructure Microelectronics with TWHM2005) Category: High-Speed HBTs and ICs Keyword: heterojunction bipolar transistor, reliability, rapid thermal annealing, GaAs, InGaP,
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A CMOS Built-In Current Sensor for IDDQ Testing Jeong Beom KIM Seung Ho HONG
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2006/06/01 Vol. E89-C No. 6 pp. 868-870 Type of Manuscript: LETTER Category: Integrated Electronics Keyword: IDDQ testing, current testing, BICS, reliability,
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Thermal-Aware Placement Based on FM Partition Scheme and Force-Directed Heuristic Jing LI Hiroshi MIYASHITA
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2006/04/01 Vol. E89-A No. 4 pp. 989-995 Type of Manuscript: Special Section PAPER (Special Section on Selected Papers from the 18th Workshop on Circuits and Systems in Karuizawa) Category: Keyword: VLSI circuit physical design, thermal placement, partitioning, reliability, force-directed algorithm,
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Carrier-Grade Ethernet Technologies for Next Generation Wide Area Ethernet Atsushi IWATA
Publication: IEICE TRANSACTIONS on Communications Publication Date: 2006/03/01 Vol. E89-B No. 3 pp. 651-660 Type of Manuscript: Special Section PAPER (Special Section on the Next Generation Ethernet Technologies) Category: INVITED Keyword: MAN, Ethernet, reliability, QoS, OAM,
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A Reliable Broadcast/Multicast Scheme for Multihop Mobile Ad Hoc Networks Jenhui CHEN Shiann-Tsong SHEU
Publication: IEICE TRANSACTIONS on Communications Publication Date: 2006/03/01 Vol. E89-B No. 3 pp. 867-878 Type of Manuscript: PAPER Category: Terrestrial Radio Communications Keyword: ad hoc, broadcast, MAC, multicast, protocol, reliability, wireless LAN,
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On-Chip Thermal Gradient Analysis and Temperature Flattening for SoC Design Takashi SATO Junji ICHIMIYA Nobuto ONO Koutaro HACHIYA Masanori HASHIMOTO
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2005/12/01 Vol. E88-A No. 12 pp. 3382-3389 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Prediction and Analysis Keyword: thermal simulation, thermal gradient, temperature flattening, clock skew, reliability, timing,
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Low Power and Fault Tolerant Encoding Methods for On-Chip Data Transfer in Practical Applications Satoshi KOMATSU Masahiro FUJITA
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2005/12/01 Vol. E88-A No. 12 pp. 3282-3289 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Low Power Methodology Keyword: bus encoding, ECC/EDC, low power, reliability,
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Application-Level Causally Ordered Broadcast for Large-Scale Group Communication ChaYoung KIM JinHo AHN ChongSun HWANG
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2005/12/01 Vol. E88-D No. 12 pp. 2883-2889 Type of Manuscript: LETTER Category: Dependable Computing Keyword: group communication, causal order delivery, gossip, scalability, reliability,
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A Heuristic Search Method with the Reduced List of Test Error Patterns for Maximum Likelihood Decoding Hideki YAGI Toshiyasu MATSUSHIMA Shigeichi HIRASAWA
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2005/10/01 Vol. E88-A No. 10 pp. 2721-2733 Type of Manuscript: Special Section PAPER (Special Section on Information Theory and Its Applications) Category: Coding Theory Keyword: maximum likelihood decoding, binary block codes, heuristic search, most reliable basis, reliability,
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A Broadcast Engagement ACK Mechanism for Reliable Broadcast Transmission in Mobile Ad Hoc Networks Jenhui CHEN Muwen HUANG
Publication: IEICE TRANSACTIONS on Communications Publication Date: 2005/09/01 Vol. E88-B No. 9 pp. 3570-3578 Type of Manuscript: Special Section PAPER (Special Section on Advances in Ad Hoc Mobile Communications and Networking) Category: Keyword: ad hoc, broadcast, network, MAC, reliability, wireless,
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Transient Bit Error Recovery Scheme for ROM-Based Embedded Systems Sang-Moon RYU Dong-Jo PARK
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2005/09/01 Vol. E88-D No. 9 pp. 2209-2212 Type of Manuscript: LETTER Category: Dependable Computing Keyword: transient bit error, memory scrubbing, reliability, embedded system,
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Load Limits of Ultra Miniature Electromechanical Signal Relays Werner JOHLER Alexander NEUHAUS
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2005/08/01 Vol. E88-C No. 8 pp. 1620-1628 Type of Manuscript: Special Section PAPER (Special Section on Recent Development of Electro-Mechanical Devices--Selected Papers from International Session on Electro-Mechanical Devices 2004 (IS-EMD2004)--) Category: Relays and Switches Keyword: electromechanical devices, telecom- and signal relays, lead free soldering, reliability, mixed assemblies,
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Making Reactive Systems Highly Reliable by Hypersequential Programming Naoshi UCHIHIRA
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2005/04/01 Vol. E88-A No. 4 pp. 941-947 Type of Manuscript: Special Section PAPER (Special Section on Selected Papers from the 17th Workshop on Circuits and Systems in Karuizawa) Category: Keyword: reactive system, reliability, scenario, hypersequential programming,
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Electrical Characterization of Aluminum-Oxynitride Stacked Gate Dielectrics Prepared by a Layer-by-Layer Process of Chemical Vapor Deposition and Rapid Thermal Nitridation Hideki MURAKAMI Wataru MIZUBAYASHI Hirokazu YOKOI Atsushi SUYAMA Seiichi MIYAZAKI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2005/04/01 Vol. E88-C No. 4 pp. 640-645 Type of Manuscript: Special Section PAPER (Special Section on Fundamental and Application of Advanced Semiconductor Devices) Category: Si Devices and Processes Keyword: high-k dielectrics, aluminum oxide, reliability, MISFET,
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Effect of Purge Gas on the Reliability of a 266 nm Continuous-Wave Solid-State Laser Hiroyuki WADA Michio OKA Koichi TATSUKI Masaki SAITO Shigeo KUBOTA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2004/12/01 Vol. E87-C No. 12 pp. 2186-2188 Type of Manuscript: LETTER Category: Lasers, Quantum Electronics Keyword: UV laser, reliability, purge gas, scattering,
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A Framework for Reliable Data Delivery in Delay Bounded Overlay Multicast Ki-Il KIM Dong-Kyun KIM Sang-Ha KIM
Publication: IEICE TRANSACTIONS on Communications Publication Date: 2004/11/01 Vol. E87-B No. 11 pp. 3356-3360 Type of Manuscript: LETTER Category: Network Keyword: reliability, delay bound, overlay multicast,
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Impact of Lead Free Soldering Processes on the Reliability of Electromechanical Switching Devices Werner JOHLER
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2004/08/01 Vol. E87-C No. 8 pp. 1225-1234 Type of Manuscript: Special Section PAPER (Special Section on IS-EMD2003--Recent Technical Trend of Electro-Mechanical Devices) Category: New Technology and Automotive Applications Keyword: electromechanical devices, telecom- and signal relays, lead free soldering, reliability, mixed assemblies,
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An Efficient Algorithm for Computing the Reliability of Stochastic Binary Systems Min-Sheng LIN
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2004/03/01 Vol. E87-D No. 3 pp. 745-750 Type of Manuscript: PAPER Category: Algorithms Keyword: reliability, stochastic binary system, union of products problem, difference graph,
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A Mobile Multicast Protocol with Error Control for IP Networks Chunhung Richard LIN Chang-Jai CHUNG
Publication: IEICE TRANSACTIONS on Communications Publication Date: 2004/03/01 Vol. E87-B No. 3 pp. 695-704 Type of Manuscript: PAPER Category: Network Keyword: mobile IP, mobile multicast, reliability, scalability,
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Reliability of Athermal Fiber Bragg Grating Component with Negative Thermal Expansion Ceramic Substrate Satoru YOSHIHARA Takahiro MATANO Hiroshi OOSHIMA Akihiko SAKAMOTO
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2003/12/01 Vol. E86-C No. 12 pp. 2501-2503 Type of Manuscript: LETTER Category: Optoelectronics Keyword: fiber Bragg grating, reliability, thermal expansion, ceramic substrate, athermal,
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Design and Analysis of a Highly-Available Network File Server Group Fengjung LIU Chu-sing YANG
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2003/11/01 Vol. E86-D No. 11 pp. 2291-2299 Type of Manuscript: Special Section PAPER (Special Issue on New Technologies in the Internet and their Applications) Category: Keyword: NFS, data consistency, reliability, server group,
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Reliability Analysis of GaN-Based LEDs for Solid State Illumination Gaudenzio MENEGHESSO Simone LEVADA Roberto PIEROBON Fabiana RAMPAZZO Enrico ZANONI Anna CAVALLINI Manfredo MANFREDI Shawn DU Ivan ELIASHEVICH
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2003/10/01 Vol. E86-C No. 10 pp. 2032-2038 Type of Manuscript: Special Section PAPER (Special Issue on Heterostructure Microelectronics with TWHM2003) Category: Keyword: high brightness GaN LED, reliability, traps,
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Novel Built-In Current Sensor for On-Line Current Testing Chul Ho KWAK Jeong Beom KIM
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2003/09/01 Vol. E86-C No. 9 pp. 1898-1902 Type of Manuscript: LETTER Category: Integrated Electronics Keyword: built-in current sensor, current testing, VLSI, reliability,
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Reliability of a 2-Dimensional Consecutive k-out-of-n:F System with a Restriction in the Number of Failed Components Tetsushi YUGE Masaharu DEHARE Shigeru YANAGI
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2003/06/01 Vol. E86-A No. 6 pp. 1535-1540 Type of Manuscript: PAPER Category: Reliability, Maintainability and Safety Analysis Keyword: reliability, approximation, 2-dimensional consecutive k-out-of-n:F:system,
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Influence of Silicone Vapor on Micro-Motor Reliability Terutaka TAMAI Kiyoshi OGAWA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2003/06/01 Vol. E86-C No. 6 pp. 885-890 Type of Manuscript: Special Section PAPER (Special Issue on Recent Development of Electro-Mechanical Devices (IS-EMD 2002)) Category: Contact Phenomena Keyword: silicone vapor, micro-motor, contamination, reliability, SiO₂,
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Reliability and Lifetime Estimation for Large-Scale Photonic Cross-Connect Switches of Photonic Networks Kazuhiro NOGUCHI Masafumi KOGA
Publication: IEICE TRANSACTIONS on Communications Publication Date: 2003/05/01 Vol. E86-B No. 5 pp. 1530-1538 Type of Manuscript: Special Section PAPER (Joint Special Issue on Recent Progress in Optoelectronics and Communications) Category: Keyword: photonic network, optical switch, reliability,
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Analysis of the Effect of Supplementing a Shortcut Link to Ring Networks Takao MATSUMOTO Hitoshi OTSUKI
Publication: IEICE TRANSACTIONS on Communications Publication Date: 2003/05/01 Vol. E86-B No. 5 pp. 1641-1652 Type of Manuscript: PAPER Category: Network Keyword: ring network, shortcut, cost, reliability, path,
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Reliability of Low Temperature Poly-Si GOLD (Gate-Overlapped LDD) Structure TFTs Tetsuo KAWAKITA Hidehiro NAKAGAWA Yukiharu URAOKA Takashi FUYUKI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2002/11/01 Vol. E85-C No. 11 pp. 1854-1859 Type of Manuscript: Special Section PAPER (Special Issue on Electronic Displays) Category: Active Matrix Displays Keyword: low temperature poly-Si, TFT, reliability, GOLD, system on panel,
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Reliability-Based Mirroring of Servers in Distributed Networks Akiko NAKANIWA Jun TAKAHASHI Hiroyuki EBARA Hiromi OKADA
Publication: IEICE TRANSACTIONS on Communications Publication Date: 2002/02/01 Vol. E85-B No. 2 pp. 540-549 Type of Manuscript: PAPER Category: Network Management/Operation Keyword: load balancing, reliability, mirroring, distributed database system, Internet,
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Reliability of InGaP and AlGaAs HBT Noren PAN Roger E. WELSER Kevin S. STEVENS Charles R. LUTZ
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2001/10/01 Vol. E84-C No. 10 pp. 1366-1372 Type of Manuscript: INVITED PAPER (Joint Special Issue on Heterostructure Microelectronics with TWHM 2000 (Topical Workshop on Heterostructure Microelectronics 2000)) Category: III-V HBTs Keyword: HBT, MOCVD, reliability, microwave devices,
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Hydrogen Degradation of InP HEMTs and GaAs PHEMTs Jesus A. del ALAMO Roxann R. BLANCHARD Samuel D. MERTENS
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2001/10/01 Vol. E84-C No. 10 pp. 1289-1293 Type of Manuscript: INVITED PAPER (Joint Special Issue on Heterostructure Microelectronics with TWHM 2000 (Topical Workshop on Heterostructure Microelectronics 2000)) Category: Hetero-FETs & Their Integrated Circuits Keyword: high-electron mobility transistor, hydrogen, reliability, InP, GaAs,
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Estimation of Imprint Failure Lifetime in FeRAM with Pt/SrBi₂Ta₂O₉/Pt Capacitor Young Min KANG Seaung Suk LEE Beelyong YANG Choong Heui CHUNG Hun Woo KYE Suk Kyoung HONG Nam Soo KANG
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2001/06/01 Vol. E84-C No. 6 pp. 757-762 Type of Manuscript: Special Section PAPER (Special Issue on Nonvolatile Memories) Category: FeRAMs Keyword: ferroelectric, nonvolatile, memory, FeRAM, imprint, reliability,
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An Acquisition Method Using Correlation Mapping with False Alarm Penalty in M-ary/SS Systems Yuuki OKAZAKI Masanori HAMAMURA Shin'ichi TACHIKAWA
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2001/06/01 Vol. E84-A No. 6 pp. 1572-1580 Type of Manuscript: PAPER Category: Spread Spectrum Technologies and Applications Keyword: M-ary/SS, correlation mapping, false alarm penalty, average acquisition time, reliability,
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Highly Reliable and High Power 980 nm Pump Laser Diode Module for Undersea Cable Systems Masashi USAMI Yuichi MATSUSHIMA Hideyoshi HORIE Hideaki KANEDA
Publication: IEICE TRANSACTIONS on Communications Publication Date: 2001/05/01 Vol. E84-B No. 5 pp. 1265-1273 Type of Manuscript: INVITED PAPER (Joint Special Issue on Recent Progress in Optoelectronics and Communications) Category: Optical Active Devices and Modules Keyword: 980-nm pump laser, EDFA, WDM, undersea system, reliability,
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Highly Reliable and High Power 980 nm Pump Laser Diode Module for Undersea Cable Systems Masashi USAMI Yuichi MATSUSHIMA Hideyoshi HORIE Hideaki KANEDA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2001/05/01 Vol. E84-C No. 5 pp. 639-647 Type of Manuscript: INVITED PAPER (Joint Special Issue on Recent Progress in Optoelectronics and Communications) Category: Optical Active Devices and Modules Keyword: 980-nm pump laser, EDFA, WDM, undersea system, reliability,
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Reliable Multicast Protocol with a Representative Acknowledgment Scheme for Wireless Systems Yasuhiko INOUE Masataka IIZUKA Hitoshi TAKANASHI Masahiro MORIKURA
Publication: IEICE TRANSACTIONS on Communications Publication Date: 2001/04/01 Vol. E84-B No. 4 pp. 853-862 Type of Manuscript: Special Section PAPER (Special Issue on Mobile Multimedia Communications) Category: Keyword: multicast, reliability, retransmission, station group,
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New Self-Healing Scheme that Realizes Multiple Reliability on ATM Networks Taishi YAHARA Ryutaro KAWAMURA
Publication: IEICE TRANSACTIONS on Communications Publication Date: 2000/12/20 Vol. E83-B No. 12 pp. 2615-2625 Type of Manuscript: PAPER Category: Switching Keyword: restoration, self-healing, failure, reliability, ATM,
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A Generalization of Consecutive k-out-of-n:G Systems Min-Sheng LIN Ming-Sang CHANG Deng-Jyi CHEN
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2000/06/20 Vol. E83-D No. 6 pp. 1309-1313 Type of Manuscript: LETTER Category: Fault Tolerance Keyword: reliability, consecutive-k-out-of-n:G system, distributed computing system,
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On the Concept of "Stability" in Asynchronous Distributed Decision-Making Systems Tony S. LEE Sumit GHOSH
Publication: IEICE TRANSACTIONS on Communications Publication Date: 2000/05/20 Vol. E83-B No. 5 pp. 1023-1038 Type of Manuscript: Special Section PAPER (IEICE/IEEE Joint Special Issue on Autonomous Decentralized Systems) Category: Real Time Control Keyword: stability, instability, reliability, catastrophic failure, performance, asynchronous distributed algorithms, complexity, decision-making,
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Optimum Order Time for a Spare Part Inventory System Modeled by a Non-Regenerative Stochastic Petri Net Qun JIN Richard F. VIDALE Yoshio SUGASAWA
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2000/05/20 Vol. E83-A No. 5 pp. 818-827 Type of Manuscript: Special Section PAPER (Special Section on Reliability Theory and Its Applications) Category: Keyword: maintenance, Markov processes, Petri nets, optimization, reliability,
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Digital Watermarking Technique for Motion Pictures Based on Quantization Hiroshi OGAWA Takao NAKAMURA Atsuki TOMIOKA Youichi TAKASHIMA
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2000/01/20 Vol. E83-A No. 1 pp. 77-89 Type of Manuscript: Special Section PAPER (Special Section on Cryptography and Information Security) Category: Keyword: motion picture watermarking, adaptive quantization, reliability, soft decision, MPEG,
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Reliability of AlGaAs and InGaP Heterojunction Bipolar Transistors Noren PAN Roger E. WELSER Charles R. LUTZ James ELLIOT Jesse P. RODRIGUES
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1999/11/20 Vol. E82-C No. 11 pp. 1886-1894 Type of Manuscript: INVITED PAPER (Special Issue on High-Frequency/High-Speed Devices for Information and Communication Systems in the 21st Century) Category: RF Power Devices Keyword: HBT, InGaP/GaAs HBTs, AlGaAs/GaAs HBTs, MOCVD, reliability, microwave devices,
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Highly Sensitive OBIRCH System for Fault Localization and Defect Detection Kiyoshi NIKAWA Shoji INOUE
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 1998/07/20 Vol. E81-D No. 7 pp. 743-748 Type of Manuscript: Special Section PAPER (Special Issue on Test and Diagnosis of VLSI) Category: Beam Testing/Diagnosis Keyword: VLSI chip, fault localization, metal line defect detection, high resistivity, TiSi, Al, reliability, yield, failure analysis,
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Application of Circuit-Level Hot-Carrier Reliability Simulation to Memory Design Peter M. LEE Tsuyoshi SEO Kiyoshi ISE Atsushi HIRAISHI Osamu NAGASHIMA Shoji YOSHIDA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1998/04/20 Vol. E81-C No. 4 pp. 595-601 Type of Manuscript: PAPER Category: Electronic Circuits Keyword: hot-carrier degradation, reliability, device lifetime, circuit simulation, SRAM, DRAM,
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Effect of Zr/Ti Ratio on the Reliability Characteristics Behavior of Sol-Gel Derived PZT Films on Pt/IrO₂ Electrode Katsuyoshi MATSUURA Kazuaki TAKAI Tetsuro TAMURA Hiroshi ASHIDA Seigen OTANI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1998/04/20 Vol. E81-C No. 4 pp. 528-536 Type of Manuscript: Special Section PAPER (Special Issue on Advanced Memory Devices Using High-Dielectric-Constant and Ferroelectric Thin Films) Category: Keyword: PZT, sol-gel, IrO₂, Zr/Ti ratio, reliability,
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Reliability of Sn-Sb Solder for Mounting Si Chip and Passive Elements on Insulated Metal Substrate Yasutoshi KURIHARA Tsuneo ENDOH
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1998/03/20 Vol. E81-C No. 3 pp. 439-446 Type of Manuscript: PAPER Category: Integrated Electronics Keyword: reliability, Sn-Sb solder, insulated metal substrate, Si chip, passive element,
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Architecture of a Multigigabit ATM Core Switch for the B-ISDN Erwin P. RATHGEB
Publication: IEICE TRANSACTIONS on Communications Publication Date: 1998/02/20 Vol. E81-B No. 2 pp. 251-257 Type of Manuscript: Special Section PAPER (Special Issue on ATM Switching Systems for future B-ISDN) Category: ATM switching architecture Keyword: ATM switch, reliability, ATM switch fabric, implementation,
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Reliability Modeling of Declustered-Parity RAID Considering Uncorrectable Bit Errors Xuefeng WU Jie LI Hisao KAMEDA
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 1997/08/20 Vol. E80-A No. 8 pp. 1508-1515 Type of Manuscript: PAPER Category: Reliability and Fault Analysis Keyword: uncorrectable bit errors, reliability, analytic model, disk arrays, RAID,
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Three-Mode Failure Model for Reliability Analysis of Distributed Programs Tatsuhiro TSUCHIYA Yoshiaki KAKUDA Tohru KIKUNO
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 1997/01/20 Vol. E80-D No. 1 pp. 3-9 Type of Manuscript: Special Section PAPER (Special Issue on Fault-Tolerant Computing) Category: Distributed Systems Keyword: distributed system, distributed programs, reliability, 3-mode failure, file spanning tree,
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High Responsivity, Low Dark Current, and Highly Reliable Operation of InGaAlAs Waveguide Photodiodes for Optical Hybrid Integration Hitoshi NAKAMURA Masato SHISHIKURA Shigehisa TANAKA Yasunobu MATSUOKA Tsunao ONO Takao MIYAZAKI Shinji TSUJI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1997/01/20 Vol. E80-C No. 1 pp. 41-46 Type of Manuscript: Special Section PAPER (Special Issue on Devices, Packaging Technology, and Subsystems for the Optical Access Network) Category: Keyword: optical access, optical platform, hybrid integration, planar lightwave circuit, waveguide photodiode, photodiode, molecular beam epitaxy, passivation, reliability,
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A 250 mV Bit-Line Swing Scheme for 1-V Operating Gigabit Scale DRAMs Tsuneo INABA Daisaburo TAKASHIMA Yukihito OOWAKI Tohru OZAKI Shigeyoshi WATANABE Takashi OHSAWA Kazunori OHUCHI Hiroyuki TANGO
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1996/12/20 Vol. E79-C No. 12 pp. 1699-1706 Type of Manuscript: Special Section PAPER (Special Issue on Low-Power LSI Technologies) Category: Keyword: DRAM, power dissipation, reliability, bit-line, wordline, small swing, threshold voltage, sense amplifier, memory cell,
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Striping in a Disk Array with Data/Parity Placement Scheme RM2 Tolerating Double Disk Failures^* Chan-Ik PARK
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 1996/08/20 Vol. E79-D No. 8 pp. 1072-1085 Type of Manuscript: Special Section PAPER (Special Issue on Architectures, Algorithms and Networks for Massively Parallel Computing) Category: Disk array Keyword: data placement, disk array, performance, reliability, striping,
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A Novel Threshold Voltage Distribution Measuring Technique for Flash EEPROM Devices Toshihiko HIMENO Naohiro MATSUKAWA Hiroaki HAZAMA Koji SAKUI Masamitsu OSHIKIRI Kazunori MASUDA Kazushige KANDA Yasuo ITOH Jin-ichi MIYAMOTO
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1996/02/20 Vol. E79-C No. 2 pp. 145-151 Type of Manuscript: Special Section PAPER (Special Issue on Microelectronic Test Structures) Category: Device and Circuit Characterization Keyword: flash memory, V_th distribution, reliability, NAND flash, nonvolatile memory,
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Test Structures and a Modified Transmission Line Pulse System for the Study of Electrostatic Discharge Robert A. ASHTON
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1996/02/20 Vol. E79-C No. 2 pp. 158-164 Type of Manuscript: Special Section PAPER (Special Issue on Microelectronic Test Structures) Category: Device and Circuit Characterization Keyword: integrated electronics, semiconductor materials and devices, ESD, test structures, reliability,
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An Optimum Logical-Design Scheme for Flexible Multi-QoS ATM Networks Guaranteeing Reliability Eiji OKI Naoaki YAMANAKA
Publication: IEICE TRANSACTIONS on Communications Publication Date: 1995/07/20 Vol. E78-B No. 7 pp. 1016-1024 Type of Manuscript: Special Section PAPER (Special Issue on Multimedia Computer Networks) Category: Keyword: ATM, QoS, network design, reliability, disjoint route,
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Design of Highly Reliable Optical Fiber Cable Network in Access Networks Motoi IWASHITA Hisao OIKAWA Hideo IMANAKA Ryuji TOYOSHIMA
Publication: IEICE TRANSACTIONS on Communications Publication Date: 1995/07/20 Vol. E78-B No. 7 pp. 1033-1042 Type of Manuscript: PAPER Category: Communication Networks and Service Keyword: communication networks and services, network design, reliability, heuristic algorithms, access networks,
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A Recursive Matrix-Calculation Method for Disjoint Path Search with Hop Link Number Constraints Eiji OKI Naoaki YAMANAKA
Publication: IEICE TRANSACTIONS on Communications Publication Date: 1995/05/20 Vol. E78-B No. 5 pp. 769-774 Type of Manuscript: LETTER Category: Communication Networks and Service Keyword: disjoint path, reliability, matrix calculation, network design,
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Water Sensing Method with OTDR and Optical Sensor for Non-pressurized Optical Fiber Cable System Seiji TAKASHIMA Masaaki KAWASE Shigeru TOMITA
Publication: IEICE TRANSACTIONS on Communications Publication Date: 1994/06/20 Vol. E77-B No. 6 pp. 794-799 Type of Manuscript: PAPER Category: Optical Communication Keyword: communication cable, optical fiber, water sensing, reliability,
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Defect Detection of Passivation Layer by a Bias-Free Cu Decoration Method Tetsuaki WADA Shinji NAKANO
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1994/04/20 Vol. E77-C No. 4 pp. 585-589 Type of Manuscript: Special Section PAPER (Special Issue on LSI Failure Analysis) Category: Keyword: semiconductor, passivation, defect, reliability, humidity test,
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Evaluation of Plasma Damage to Gate Oxide Yukiharu URAOKA Koji ERIGUCHI Tokuhiko TAMAKI Kazuhiko TSUJI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1994/03/20 Vol. E77-C No. 3 pp. 453-458 Type of Manuscript: Special Section PAPER (Special Issue on Quarter Micron Si Device and Process Technologies) Category: Process Technology Keyword: Q_BD, gate oxide, plasma, reliability, damage, photon emission, LOCOS, thinning,
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Total High Performance Time and Design of Degradable Real-Time Systems Masaharu AKATSU Tomohiro MURATA Kenzo KURIHARA
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 1994/03/20 Vol. E77-A No. 3 pp. 510-516 Type of Manuscript: Special Section PAPER (Special Section on the 6th Karuizawa Workshop on Circuits and Systems) Category: Concurrent Systems, Discrete Event Systems and Petri Nets Keyword: availability, reliability, performance, fault-tolerance, modeling, Petri nets,
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Reliability of a 3-State System Subject to Flow Quantity Constraint Tetsushi YUGE Masafumi SASAKI Shigeru YANAGI
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 1994/01/20 Vol. E77-A No. 1 pp. 129-133 Type of Manuscript: Special Section PAPER (Special Section on Reliability) Category: System Reliability Keyword: open failure, short failure, 3-state, j or more separate paths, reliability,
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The Enhancement of Electromigration Lifetime under High Frequency Pulsed Conditions Kazunori HIRAOKA Kazumitsu YASUDA
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 1994/01/20 Vol. E77-A No. 1 pp. 195-203 Type of Manuscript: Special Section PAPER (Special Section on Reliability) Category: Reliability Testing Keyword: fault analysis, testing and verification, reliability, availability and vulnerability,
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Via Electromigration Characteristics in Aluminum Based Multilevel Interconnection Takahisa YAMAHA Masaru NAITO Tadahiko HOTTA
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 1994/01/20 Vol. E77-A No. 1 pp. 187-194 Type of Manuscript: Special Section PAPER (Special Section on Reliability) Category: Failure Physics and Failure Analysis Keyword: reliability, electromigration, metallization, via contact, multilevel interconnection, laminated interconnections, aluminum,
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Reliability of Low-Noise HEMTs under Gamma-Ray Irradiation Yasunobu SAITO Fumio SASAKI Hisao KAWASAKI Hiroshi ISHIMURA Hirokuni TOKUDA Motoharu OHTOMO
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1993/09/20 Vol. E76-C No. 9 pp. 1379-1383 Type of Manuscript: Special Section PAPER (Special Issue on Heterostructure Electron Devices) Category: Keyword: reliability, HEMT, γ-ray, degradation,
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A New Technique for Evaluating Gate Oxide Reliability Using a Photon Emission Method Yukiharu URAOKA Kazuhiko TSUJI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1993/04/20 Vol. E76-C No. 4 pp. 519-524 Type of Manuscript: Special Section PAPER (Special Issue on Sub-Half Micron Si Device and Process Technologies) Category: Device Technology Keyword: reliability, photon emission, TDDB, gate oxide, LOCOS,
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Effects of Synchrotron X-Ray Irradiation on Hot Carrier Reliability in Subquarter-Micrometer NMOSFETs Toshiaki TSUCHIYA Mitsuru HARADA Kimiyoshi DEGUCHI Tadahito MATSUDA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1993/04/20 Vol. E76-C No. 4 pp. 506-510 Type of Manuscript: INVITED PAPER (Special Issue on Sub-Half Micron Si Device and Process Technologies) Category: Device Technology Keyword: MOSFET, reliability, hot carrier, synchrotron X-ray,
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1/5 Power Law in PN-Junction Failure Mechanism Caused by Electrical-Over-Stress Yutaka TAJIMA Kunihiro ASADA Takuo SUGANO
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1992/02/20 Vol. E75-C No. 2 pp. 207-215 Type of Manuscript: Special Section PAPER (Special Issue on Selected Papers from '91 VPAD) Category: Keyword: reliability, failure, pn-junction, silicon, electrostatic-discharge,
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