Keyword : reliability


Reliability Analysis of Scaled NAND Flash Memory Based SSDs with Real Workload Characteristics by Using Real Usage-Based Precise Reliability Test
Yusuke YAMAGA Chihiro MATSUI Yukiya SAKAKI Ken TAKEUCHI 
Publication:   
Publication Date: 2018/04/01
Vol. E101-C  No. 4 ; pp. 243-252
Type of Manuscript:  Special Section PAPER (Special Section on Solid-State Circuit Design — Architecture, Circuit, Device and Design Methodology)
Category: 
Keyword: 
solid-state drivereliabilityNAND flash memory
 Summary | Full Text:PDF(1.7MB)

Replication of Random Telegraph Noise by Using a Physical-Based Verilog-AMS Model
Takuya KOMAWAKI Michitarou YABUUCHI Ryo KISHIDA Jun FURUTA Takashi MATSUMOTO Kazutoshi KOBAYASHI 
Publication:   
Publication Date: 2017/12/01
Vol. E100-A  No. 12 ; pp. 2758-2763
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: 
Keyword: 
Random Telegraph NoisereliabilityVerilog-AMS
 Summary | Full Text:PDF(2.1MB)

A Novel Component Ranking Method for Improving Software Reliability
Lixing XUE Decheng ZUO Zhan ZHANG Na WU 
Publication:   
Publication Date: 2017/10/01
Vol. E100-D  No. 10 ; pp. 2653-2658
Type of Manuscript:  LETTER
Category: Dependable Computing
Keyword: 
large-scale systemcomponent rankingreliabilityinverse pagerank
 Summary | Full Text:PDF(373.5KB)

Task Scheduling Based Redundant Task Allocation Method for the Multi-Core Systems with the DTTR Scheme
Hiroshi SAITO Masashi IMAI Tomohiro YONEDA 
Publication:   
Publication Date: 2017/07/01
Vol. E100-A  No. 7 ; pp. 1363-1373
Type of Manuscript:  Special Section PAPER (Special Section on Design Methodologies for System on a Chip)
Category: 
Keyword: 
multi-core systemstask allocationfault patternstask schedulingreliability
 Summary | Full Text:PDF(680.1KB)

Utilization of Path-Clustering in Efficient Stress-Control Gate Replacement for NBTI Mitigation
Shumpei MORITA Song BIAN Michihiro SHINTANI Masayuki HIROMOTO Takashi SATO 
Publication:   
Publication Date: 2017/07/01
Vol. E100-A  No. 7 ; pp. 1464-1472
Type of Manuscript:  Special Section PAPER (Special Section on Design Methodologies for System on a Chip)
Category: 
Keyword: 
NBTI mitigationreliabilitytransistor agingperformance degradationinternal node control
 Summary | Full Text:PDF(936.4KB)

Computing K-Terminal Reliability of Circular-Arc Graphs
Chien-Min CHEN Min-Sheng LIN 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2016/12/01
Vol. E99-D  No. 12 ; pp. 3047-3052
Type of Manuscript:  PAPER
Category: Fundamentals of Information Systems
Keyword: 
algorithmreliabilitycircular-arc graphsinterval graphs
 Summary | Full Text:PDF(840.4KB)

Reliability and Failure Impact Analysis of Distributed Storage Systems with Dynamic Refuging
Hiroaki AKUTSU Kazunori UEDA Takeru CHIBA Tomohiro KAWAGUCHI Norio SHIMOZONO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2016/09/01
Vol. E99-D  No. 9 ; pp. 2259-2268
Type of Manuscript:  PAPER
Category: Data Engineering, Web Information Systems
Keyword: 
erasure codinghighly redundant storage systemsreliabilityrebuildMonte Carlo simulation
 Summary | Full Text:PDF(1.6MB)

Reducing Aging Effects on Ternary CAM
Ing-Chao LIN Yen-Han LEE Sheng-Wei WANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2016/07/01
Vol. E99-C  No. 7 ; pp. 878-891
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
ternary content addressable memory (CAM)negative bias temperature instability (NBTI)positive bias temperature instability (PBTI)reliabilitypower gating
 Summary | Full Text:PDF(2.4MB)

Fast Estimation of NBTI-Induced Delay Degradation Based on Signal Probability
Song BIAN Michihiro SHINTANI Masayuki HIROMOTO Takashi SATO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2016/07/01
Vol. E99-A  No. 7 ; pp. 1400-1409
Type of Manuscript:  Special Section PAPER (Special Section on Design Methodologies for System on a Chip)
Category: 
Keyword: 
NBTIreliabilitystatic timing analysistiming characterizationaging-aware timing library
 Summary | Full Text:PDF(1017.4KB)

Computing Terminal Reliability of Multi-Tolerance Graphs
Chien-Min CHEN Min-Sheng LIN 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2016/07/01
Vol. E99-D  No. 7 ; pp. 1733-1741
Type of Manuscript:  PAPER
Category: Fundamentals of Information Systems
Keyword: 
algorithmreliabilitymulti-tolerance graphtrapezoid graph
 Summary | Full Text:PDF(979.1KB)

Improvement of Reliability Evaluation for 2-Unit Parallel System with Cascading Failures by Using Maximal Copula
Shuhei OTA Takao KAGEYAMA Mitsuhiro KIMURA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2015/10/01
Vol. E98-A  No. 10 ; pp. 2096-2100
Type of Manuscript:  Special Section LETTER (Special Section on Recent Developments on Reliability, Maintainability and Dependability)
Category: 
Keyword: 
reliabilityparallel systemcascading failuremaximal copula
 Summary | Full Text:PDF(354.6KB)

An Error Correction Scheme through Time Redundancy for Enhancing Persistent Soft-Error Tolerance of CGRAs
Takashi IMAGAWA Masayuki HIROMOTO Hiroyuki OCHI Takashi SATO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2015/07/01
Vol. E98-C  No. 7 ; pp. 741-750
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
coarse-grained reconfigurable architecturereliabilitytriple modular redundancyimmediate terminationerror-critical period
 Summary | Full Text:PDF(1.4MB)

Correlations between BTI-Induced Degradations and Process Variations on ASICs and FPGAs
Michitarou YABUUCHI Ryo KISHIDA Kazutoshi KOBAYASHI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2014/12/01
Vol. E97-A  No. 12 ; pp. 2367-2372
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Device and Circuit Modeling and Analysis
Keyword: 
BTIprocess variationreliability
 Summary | Full Text:PDF(1.2MB)

An Oscillation-Based On-Chip Temperature-Aware Dynamic Voltage and Frequency Scaling Scheme in System-on-a-Chip
Katherine Shu-Min LI Yingchieh HO Yu-Wei YANG Liang-Bi CHEN 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2014/09/01
Vol. E97-D  No. 9 ; pp. 2320-2329
Type of Manuscript:  Special Section PAPER (Special Section on Multiple-Valued Logic and VLSI Computing)
Category: Circuit Implementations
Keyword: 
DVFSmeasurement and simulation of multiple-processor (multicores, PSoC) systemsreal-time distributed systemsreliabilitythermal effect control scheme
 Summary | Full Text:PDF(1.7MB)

NBTI Mitigation Method by Inputting Random Scan-In Vectors in Standby Time
Hiroaki KONOURA Toshihiro KAMEDA Yukio MITSUYAMA Masanori HASHIMOTO Takao ONOYE 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2014/07/01
Vol. E97-A  No. 7 ; pp. 1483-1491
Type of Manuscript:  Special Section PAPER (Special Section on Design Methodologies for System on a Chip)
Category: 
Keyword: 
NBTINBTI mitigationperformance degradationscan pathagingreliability
 Summary | Full Text:PDF(2.5MB)

Reliable Decentralized Diagnosis of Discrete Event Systems Using the Conjunctive Architecture
Takashi YAMAMOTO Shigemasa TAKAI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2014/07/01
Vol. E97-A  No. 7 ; pp. 1605-1614
Type of Manuscript:  PAPER
Category: Concurrent Systems
Keyword: 
discrete event systemdecentralized diagnosisconjunctive codiagnosabilityreliabilitydelay bound
 Summary | Full Text:PDF(1.1MB)

Test-Retest Reliability and Criterion-Related Validity of the Implicit Association Test for Measuring Shyness
Tsutomu FUJII Takafumi SAWAUMI Atsushi AIKAWA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2013/08/01
Vol. E96-A  No. 8 ; pp. 1768-1774
Type of Manuscript:  PAPER
Category: Human Communications
Keyword: 
implicit shynessimplicit association testreliabilityvalidity
 Summary | Full Text:PDF(1MB)

Effects of Fluorine Implantation on 1/f Noise, Hot Carrier and NBTI Reliability of MOSFETs
Jae-Hyung JANG Hyuk-Min KWON Ho-Young KWAK Sung-Kyu KWON Seon-Man HWANG Jong-Kwan SHIN Seung-Yong SUNG Yi-Sun CHUNG Da-Soon LEE Hi-Deok LEE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2013/05/01
Vol. E96-C  No. 5 ; pp. 624-629
Type of Manuscript:  Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
fluorineflicker noise1/f noisereliabilityhot-carrierNBTIMOSFET
 Summary | Full Text:PDF(2.3MB)

A Cost-Effective Selective TMR for Coarse-Grained Reconfigurable Architectures Based on DFG-Level Vulnerability Analysis
Takashi IMAGAWA Hiroshi TSUTSUI Hiroyuki OCHI Takashi SATO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2013/04/01
Vol. E96-C  No. 4 ; pp. 454-462
Type of Manuscript:  Special Section PAPER (Special Section on Solid-State Circuit Design—Architecture, Circuit, Device and Design Methodology)
Category: 
Keyword: 
soft errorsingle event upsettriple modular redundancyreliabilitysimulated annealing
 Summary | Full Text:PDF(1.4MB)

Self Synchronous Circuits for Robust Operation in Low Voltage and Soft Error Prone Environments
Benjamin DEVLIN Makoto IKEDA Kunihiro ASADA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2013/04/01
Vol. E96-C  No. 4 ; pp. 518-527
Type of Manuscript:  Special Section PAPER (Special Section on Solid-State Circuit Design—Architecture, Circuit, Device and Design Methodology)
Category: 
Keyword: 
self synchronousgate-levelrobustnesssingle event upsetlow voltagereliability
 Summary | Full Text:PDF(6.1MB)

Solution-Processed Photosensitive Passivation Layer for an a-Si TFT for LCDs with a Low Dielectric Constant
Akihiro TANABE Masahiro HANMURA Takeyoshi KATOH Hironori OOMORI Akira HONMA Teruhiko SUZUKI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2012/11/01
Vol. E95-C  No. 11 ; pp. 1737-1743
Type of Manuscript:  INVITED PAPER (Special Section on Electronic Displays)
Category: 
Keyword: 
passivationa-Sisolution-processedreliability
 Summary | Full Text:PDF(1MB)

BTRB: Beam Table-Based Reliable Broadcast for Directional Antennas
Laihyuk PARK Jeongseok YU Chan-Gun LEE Sungrae CHO 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2012/10/01
Vol. E95-B  No. 10 ; pp. 3307-3311
Type of Manuscript:  LETTER
Category: Network
Keyword: 
directional MACreliabilitybroadcastACK combination
 Summary | Full Text:PDF(306.4KB)

Impact of Discrete-Charge-Induced Variability on Scaled MOS Devices
Kiyoshi TAKEUCHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2012/04/01
Vol. E95-C  No. 4 ; pp. 414-420
Type of Manuscript:  INVITED PAPER (Special Section on Solid-State Circuit Design – Architecture, Circuit, Device and Design Methodology)
Category: 
Keyword: 
variabilityreliabilityrandom dopant fluctuationrandom telegraph noise
 Summary | Full Text:PDF(924.3KB)

Smart Power Supply Systems for Mission Critical Facilities
Keiichi HIROSE Tadatoshi BABASAKI 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2012/03/01
Vol. E95-B  No. 3 ; pp. 755-772
Type of Manuscript:  INVITED SURVEY PAPER
Category: 
Keyword: 
electirc powerpower qualityreliabilitymicro gridsmart gridDC powermission critical facilities
 Summary | Full Text:PDF(3.3MB)

Effects of Reliability Measures on Market Share
Masahiro HAYASHI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2011/10/01
Vol. E94-A  No. 10 ; pp. 2043-2047
Type of Manuscript:  LETTER
Category: Reliability, Maintainability and Safety Analysis
Keyword: 
reliabilityavailabilityfailure frequencymarket share
 Summary | Full Text:PDF(1.2MB)

Shaka: User Movement Estimation Considering Reliability, Power Saving, and Latency Using Mobile Phone
Arei KOBAYASHI Shigeki MURAMATSU Daisuke KAMISAKA Takafumi WATANABE Atsunori MINAMIKAWA Takeshi IWAMOTO Hiroyuki YOKOYAMA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2011/06/01
Vol. E94-D  No. 6 ; pp. 1153-1163
Type of Manuscript:  Special Section PAPER (Special Section on Emerging Technologies of Ubiquitous Computing Systems)
Category: 
Keyword: 
activity recognitionaccelerometermicrophoneGPSreliabilitypower savinglatency
 Summary | Full Text:PDF(2.3MB)

A Dynamic Continuous Signature Monitoring Technique for Reliable Microprocessors
Makoto SUGIHARA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/04/01
Vol. E94-C  No. 4 ; pp. 477-486
Type of Manuscript:  Special Section PAPER (Special Section on Circuits and Design Techniques for Advanced Large Scale Integration)
Category: 
Keyword: 
soft errorNBTISEUSETcontrol signal errorcontinuous signature monitoringreliabilityvulnerabilitymicroprocessor
 Summary | Full Text:PDF(485.3KB)

Prediction of Circuit-Performance Variations from Technology Variations for Reliable 100 nm SOC Circuit Design
Norio SADACHIKA Shu MIMURA Akihiro YUMISAKI Kou JOHGUCHI Akihiro KAYA Mitiko MIURA-MATTAUSCH Hans Jurgen MATTAUSCH 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/03/01
Vol. E94-C  No. 3 ; pp. 361-367
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
circuit simulationcompact modelDFMreliability
 Summary | Full Text:PDF(1.3MB)

Reliability Evaluation Environment for Exploring Design Space of Coarse-Grained Reconfigurable Architectures
Takashi IMAGAWA Masayuki HIROMOTO Hiroyuki OCHI Takashi SATO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2010/12/01
Vol. E93-A  No. 12 ; pp. 2524-2532
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: High-Level Synthesis and System-Level Design
Keyword: 
soft errorTMRreliabilitymethodology
 Summary | Full Text:PDF(653KB)

Dual Evanescently Coupled Waveguide Photodiodes with High Reliability for over 40-Gbps Optical Communication Systems
Kazuhiro SHIBA Yasuyuki SUZUKI Sawaki WATANABE Tadayuki CHIKUMA Takeshi TAKEUCHI Kikuo MAKITA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/12/01
Vol. E93-C  No. 12 ; pp. 1655-1661
Type of Manuscript:  PAPER
Category: Lasers, Quantum Electronics
Keyword: 
100-Gbps40-Gbpsdifferential phase shift-keying (DPSK)reliabilitywaveguide photodiode
 Summary | Full Text:PDF(637.9KB)

On Synthesizing a Reliable Multiprocessor for Embedded Systems
Makoto SUGIHARA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2010/12/01
Vol. E93-A  No. 12 ; pp. 2560-2569
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: High-Level Synthesis and System-Level Design
Keyword: 
heterogeneous multiprocessor synthesissoft errorsingle event upsetreliabilityreal-time system
 Summary | Full Text:PDF(506.4KB)

Highly Reliable and Drivability-Enhanced MOS Transistors with Rounded Nanograting Channels
Takashi ITO Xiaoli ZHU Shin-Ichiro KUROKI Koji KOTANI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/11/01
Vol. E93-C  No. 11 ; pp. 1638-1644
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
nanogratingcurrent driveeffective mobilityreliabilityTDDBNBTI
 Summary | Full Text:PDF(1000.8KB)

Highly Reliable PON Optical Splitters for Optical Access Networks in Outside Environments
Hiroshi WATANABE Noriyuki ARAKI Hisashi FUJIMOTO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/07/01
Vol. E93-C  No. 7 ; pp. 1180-1190
Type of Manuscript:  Special Section PAPER (Special Section on Photonic Technologies for Access Networks)
Category: 
Keyword: 
optical splitterreliabilityoutside environmentPONPLC
 Summary | Full Text:PDF(7.1MB)

Design and Implementation of Hybrid MAC-Based Robust Architecture for Wireless Sensor Network
Taeshik SHON Eui-jik KIM Jeongsik IN Yongsuk PARK 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2010/04/01
Vol. E93-B  No. 4 ; pp. 1016-1019
Type of Manuscript:  LETTER
Category: Network
Keyword: 
IEEE 802.15.4securityenergy consumptionreliabilitywireless sensor network
 Summary | Full Text:PDF(615.3KB)

The Software Reliability Model Based on Fractals
Yong CAO Qingxin ZHU 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2010/02/01
Vol. E93-D  No. 2 ; pp. 376-379
Type of Manuscript:  LETTER
Category: Software Engineering
Keyword: 
reliabilityfractalspredictionsoftware failure
 Summary | Full Text:PDF(295.5KB)

Practical Redundant-Via Insertion Method Considering Manufacturing Variability and Reliability
Yuji TAKASHIMA Kazuyuki OOYA Atsushi KUROKAWA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2009/12/01
Vol. E92-A  No. 12 ; pp. 2962-2970
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Physical Level Desing
Keyword: 
redundant viamanufacturing variabilityreliability
 Summary | Full Text:PDF(490.8KB)

Fiber Access Networks: Reliability Analysis and Swedish Broadband Market
Lena WOSINSKA Jiajia CHEN Claus Popp LARSEN 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2009/10/01
Vol. E92-B  No. 10 ; pp. 3006-3014
Type of Manuscript:  INVITED PAPER (Special Section on Advanced Information and Communication Technologies and Services in Conjunction with Main Topics of APCC/COIN 2008)
Category: 
Keyword: 
optical fiber LANprotectionreliabilitycapital expenditures (CAPEX)operational expenditures (OPEX)fiber-to-the-home (FTTH)passive optical network (PON)active optical network (AON)
 Summary | Full Text:PDF(1.2MB)

Empirical-Statistics Analysis for Zero-Failure GaAs MMICs Life Testing Data
Zheng-Liang HUANG Fa-Xin YU Shu-Ting ZHANG Hao LUO Ping-Hui WANG Yao ZHENG 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2009/09/01
Vol. E92-A  No. 9 ; pp. 2376-2379
Type of Manuscript:  LETTER
Category: Reliability, Maintainability and Safety Analysis
Keyword: 
MMICsreliabilityfailureaccelerated testingWeibull distributionlognormal distribution
 Summary | Full Text:PDF(127.7KB)

Temperature-Aware NBTI Modeling Techniques in Digital Circuits
Hong LUO Yu WANG Rong LUO Huazhong YANG Yuan XIE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2009/06/01
Vol. E92-C  No. 6 ; pp. 875-886
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
negative bias temperature instability (NBTI)temperaturereliability
 Summary | Full Text:PDF(447.2KB)

Reliability Inherent in Heterogeneous Multiprocessor Systems and Task Scheduling for Ameliorating Their Reliability
Makoto SUGIHARA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2009/04/01
Vol. E92-A  No. 4 ; pp. 1121-1128
Type of Manuscript:  Special Section PAPER (Special Section on Advanced Technologies Emerging Mainly from the 21st Workshop on Circuits and Systems in Karuizawa)
Category: 
Keyword: 
soft errorsingle event upsetreliabilitytask schedulingheterogeneous multiprocessor systems
 Summary | Full Text:PDF(337.4KB)

CRRT: Congestion-Aware and Rate-Controlled Reliable Transport in Wireless Sensor Networks
Muhammad Mahbub ALAM Choong Seon HONG 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2009/01/01
Vol. E92-B  No. 1 ; pp. 184-199
Type of Manuscript:  PAPER
Category: Network
Keyword: 
congestion controlrate controlreliabilityfairnesswireless sensor networks
 Summary | Full Text:PDF(1.1MB)

Design Methodology of a Sensor Network Architecture Supporting Urgent Information and Its Evaluation
Tetsuya KAWAI Naoki WAKAMIYA Masayuki MURATA 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2008/10/01
Vol. E91-B  No. 10 ; pp. 3232-3240
Type of Manuscript:  PAPER
Category: Network
Keyword: 
sensor networksurgent informationlatencyreliability
 Summary | Full Text:PDF(677.9KB)

Highly Reliable Submicron InP-Based HBTs with over 300-GHz ft
Norihide KASHIO Kenji KURISHIMA Yoshino K. FUKAI Shoji YAMAHATA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/07/01
Vol. E91-C  No. 7 ; pp. 1084-1090
Type of Manuscript:  Special Section PAPER (Special Section on Heterostructure Microelectronics with TWHM 2007)
Category: GaAs- and InP-Based Devices
Keyword: 
InP HBTspassivation ledgereliability
 Summary | Full Text:PDF(958.8KB)

Reliable Cache Architectures and Task Scheduling for Multiprocessor Systems
Makoto SUGIHARA Tohru ISHIHARA Kazuaki MURAKAMI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/04/01
Vol. E91-C  No. 4 ; pp. 410-417
Type of Manuscript:  Special Section PAPER (Special Section on Advanced Technologies in Digital LSIs and Memories)
Category: 
Keyword: 
single event upsetSRAMDRAMreliabilitycache architecturetask scheduling
 Summary | Full Text:PDF(558.2KB)

Proposal of an Assured Corridor Mechanism for Urgent Information Transmission in Wireless Sensor Networks
Tetsuya KAWAI Naoki WAKAMIYA Masayuki MURATA 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2007/10/01
Vol. E90-B  No. 10 ; pp. 2817-2826
Type of Manuscript:  PAPER
Category: Network
Keyword: 
sensor networksurgent informationfastnessreliability
 Summary | Full Text:PDF(573.1KB)

Architectural-Level Soft-Error Modeling for Estimating Reliability of Computer Systems
Makoto SUGIHARA Tohru ISHIHARA Kazuaki MURAKAMI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2007/10/01
Vol. E90-C  No. 10 ; pp. 1983-1991
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Technology toward Frontiers of New Market)
Category: VLSI Design Technology
Keyword: 
soft errorreliabilityestimationcomputer systemsinstruction-set simulation
 Summary | Full Text:PDF(670.7KB)

A Test Structure to Analyze Electrical CMOSFET Reliabilities between Center and Edge along the Channel Width
Takashi OHZONE Eiji ISHII Takayuki MORISHITA Kiyotaka KOMOKU Toshihiro MATSUDA Hideyuki IWATA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2007/02/01
Vol. E90-C  No. 2 ; pp. 515-522
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
CMOSFETreliabilityLDD-typechannel widthisolation
 Summary | Full Text:PDF(1.3MB)

Reliable Parallel File System with Parity Cache Table Support
Sheng-Kai HUNG Yarsun HSU 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2007/01/01
Vol. E90-D  No. 1 ; pp. 22-29
Type of Manuscript:  Special Section PAPER (Special Section on Parallel/Distributed Processing and Systems)
Category: Parallel Processing System
Keyword: 
clusterreliabilityparallel virtual file systemredundant array of independent disksparity cache table
 Summary | Full Text:PDF(428.9KB)

A Rate Adaptive Multicast Protocol for Providing MAC Layer Reliability in WLANs
Anas BASALAMAH Hiroki SUGIMOTO Takuro SATO 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2006/10/01
Vol. E89-B  No. 10 ; pp. 2733-2740
Type of Manuscript:  Special Section PAPER (Special Section on Mobile Multimedia Communications)
Category: 
Keyword: 
WLANreliabilityrate adaptationmulticast
 Summary | Full Text:PDF(676.6KB)

Fast Algorithm for Generating Candidate Codewords in Reliability-Based Maximum Likelihood Decoding
Hideki YAGI Toshiyasu MATSUSHIMA Shigeichi HIRASAWA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2006/10/01
Vol. E89-A  No. 10 ; pp. 2676-2683
Type of Manuscript:  Special Section LETTER (Special Section on Information Theory and Its Applications)
Category: Coding Theory
Keyword: 
maximum likelihood decodingbinary block codespriority-first searchmost reliable basisreliability
 Summary | Full Text:PDF(134.8KB)

Analytical Model on Hybrid State Saving with a Limited Number of Checkpoints and Bound Rollbacks
Mamoru OHARA Ryo SUZUKI Masayuki ARAI Satoshi FUKUMOTO Kazuhiko IWASAKI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2006/09/01
Vol. E89-A  No. 9 ; pp. 2386-2395
Type of Manuscript:  PAPER
Category: Reliability, Maintainability and Safety Analysis
Keyword: 
reliabilitydistributed systemshybrid state saving Time Warp simulationevaluation model
 Summary | Full Text:PDF(541.5KB)

Research on the Tolerance Distribution of Sealed Electromagnetic Relay with Reliability Index
Huimin LIANG Xuerong YE Guofu ZHAI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2006/08/01
Vol. E89-C  No. 8 ; pp. 1164-1172
Type of Manuscript:  Special Section PAPER (Special Section on Recent Development of Electromechanical Devices (Selected Papers from IS-EMD2005))
Category: Relays & Switches
Keyword: 
sealed electromagnetic relaytolerance distributiontolerance bandreliability
 Summary | Full Text:PDF(1.2MB)

Reliability of a 2-Dimensional Lattice System Subject to Dependent Component Failure
Tetsushi YUGE Shigeru YANAGI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2006/08/01
Vol. E89-A  No. 8 ; pp. 2192-2197
Type of Manuscript:  PAPER
Category: Reliability, Maintainability and Safety Analysis
Keyword: 
2-dimensional lattice systemdependent failurereliabilityspare
 Summary | Full Text:PDF(313.9KB)

Effects of Rapid Thermal Annealing on Bias-Stress-Induced Base Leakage in InGaP/GaAs Collector-Up Heterojunction Bipolar Transistors Fabricated with B Ion Implantation
Kazuhiro MOCHIZUKI Ken-ichi TANAKA Takashi SHIOTA Takafumi TANIGUCHI Hiroyuki UCHIYAMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2006/07/01
Vol. E89-C  No. 7 ; pp. 943-948
Type of Manuscript:  Special Section PAPER (Special Section on Heterostructure Microelectronics with TWHM2005)
Category: High-Speed HBTs and ICs
Keyword: 
heterojunction bipolar transistorreliabilityrapid thermal annealingGaAsInGaP
 Summary | Full Text:PDF(896.7KB)

A CMOS Built-In Current Sensor for IDDQ Testing
Jeong Beom KIM Seung Ho HONG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2006/06/01
Vol. E89-C  No. 6 ; pp. 868-870
Type of Manuscript:  LETTER
Category: Integrated Electronics
Keyword: 
IDDQ testingcurrent testingBICSreliability
 Summary | Full Text:PDF(470.6KB)

Thermal-Aware Placement Based on FM Partition Scheme and Force-Directed Heuristic
Jing LI Hiroshi MIYASHITA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2006/04/01
Vol. E89-A  No. 4 ; pp. 989-995
Type of Manuscript:  Special Section PAPER (Special Section on Selected Papers from the 18th Workshop on Circuits and Systems in Karuizawa)
Category: 
Keyword: 
VLSI circuit physical designthermal placementpartitioningreliabilityforce-directed algorithm
 Summary | Full Text:PDF(435.7KB)

A Reliable Broadcast/Multicast Scheme for Multihop Mobile Ad Hoc Networks
Jenhui CHEN Shiann-Tsong SHEU 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2006/03/01
Vol. E89-B  No. 3 ; pp. 867-878
Type of Manuscript:  PAPER
Category: Terrestrial Radio Communications
Keyword: 
ad hocbroadcastMACmulticastprotocolreliabilitywireless LAN
 Summary | Full Text:PDF(516.5KB)

Carrier-Grade Ethernet Technologies for Next Generation Wide Area Ethernet
Atsushi IWATA 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2006/03/01
Vol. E89-B  No. 3 ; pp. 651-660
Type of Manuscript:  INVITED PAPER (Special Section on the Next Generation Ethernet Technologies)
Category: 
Keyword: 
MANEthernetreliabilityQoSOAM
 Summary | Full Text:PDF(1.5MB)

Low Power and Fault Tolerant Encoding Methods for On-Chip Data Transfer in Practical Applications
Satoshi KOMATSU Masahiro FUJITA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2005/12/01
Vol. E88-A  No. 12 ; pp. 3282-3289
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Low Power Methodology
Keyword: 
bus encodingECC/EDClow powerreliability
 Summary | Full Text:PDF(560.9KB)

On-Chip Thermal Gradient Analysis and Temperature Flattening for SoC Design
Takashi SATO Junji ICHIMIYA Nobuto ONO Koutaro HACHIYA Masanori HASHIMOTO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2005/12/01
Vol. E88-A  No. 12 ; pp. 3382-3389
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Prediction and Analysis
Keyword: 
thermal simulationthermal gradienttemperature flatteningclock skewreliabilitytiming
 Summary | Full Text:PDF(959.9KB)

Application-Level Causally Ordered Broadcast for Large-Scale Group Communication
ChaYoung KIM JinHo AHN ChongSun HWANG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2005/12/01
Vol. E88-D  No. 12 ; pp. 2883-2889
Type of Manuscript:  LETTER
Category: Dependable Computing
Keyword: 
group communicationcausal order deliverygossipscalabilityreliability
 Summary | Full Text:PDF(972KB)

A Heuristic Search Method with the Reduced List of Test Error Patterns for Maximum Likelihood Decoding
Hideki YAGI Toshiyasu MATSUSHIMA Shigeichi HIRASAWA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2005/10/01
Vol. E88-A  No. 10 ; pp. 2721-2733
Type of Manuscript:  Special Section PAPER (Special Section on Information Theory and Its Applications)
Category: Coding Theory
Keyword: 
maximum likelihood decodingbinary block codesheuristic searchmost reliable basisreliability
 Summary | Full Text:PDF(250.2KB)

Transient Bit Error Recovery Scheme for ROM-Based Embedded Systems
Sang-Moon RYU Dong-Jo PARK 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2005/09/01
Vol. E88-D  No. 9 ; pp. 2209-2212
Type of Manuscript:  LETTER
Category: Dependable Computing
Keyword: 
transient bit errormemory scrubbingreliabilityembedded system
 Summary | Full Text:PDF(94KB)

A Broadcast Engagement ACK Mechanism for Reliable Broadcast Transmission in Mobile Ad Hoc Networks
Jenhui CHEN Muwen HUANG 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2005/09/01
Vol. E88-B  No. 9 ; pp. 3570-3578
Type of Manuscript:  Special Section PAPER (Special Section on Advances in Ad Hoc Mobile Communications and Networking)
Category: 
Keyword: 
ad hocbroadcastnetworkMACreliabilitywireless
 Summary | Full Text:PDF(507.9KB)

Load Limits of Ultra Miniature Electromechanical Signal Relays
Werner JOHLER Alexander NEUHAUS 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/08/01
Vol. E88-C  No. 8 ; pp. 1620-1628
Type of Manuscript:  Special Section PAPER (Special Section on Recent Development of Electro-Mechanical Devices--Selected Papers from International Session on Electro-Mechanical Devices 2004 (IS-EMD2004)--)
Category: Relays and Switches
Keyword: 
electromechanical devicestelecom- and signal relayslead free solderingreliabilitymixed assemblies
 Summary | Full Text:PDF(1.6MB)

Electrical Characterization of Aluminum-Oxynitride Stacked Gate Dielectrics Prepared by a Layer-by-Layer Process of Chemical Vapor Deposition and Rapid Thermal Nitridation
Hideki MURAKAMI Wataru MIZUBAYASHI Hirokazu YOKOI Atsushi SUYAMA Seiichi MIYAZAKI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/04/01
Vol. E88-C  No. 4 ; pp. 640-645
Type of Manuscript:  Special Section PAPER (Special Section on Fundamental and Application of Advanced Semiconductor Devices)
Category: Si Devices and Processes
Keyword: 
high-k dielectricsaluminum oxidereliabilityMISFET
 Summary | Full Text:PDF(503.1KB)

Making Reactive Systems Highly Reliable by Hypersequential Programming
Naoshi UCHIHIRA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2005/04/01
Vol. E88-A  No. 4 ; pp. 941-947
Type of Manuscript:  Special Section PAPER (Special Section on Selected Papers from the 17th Workshop on Circuits and Systems in Karuizawa)
Category: 
Keyword: 
reactive systemreliabilityscenariohypersequential programming
 Summary | Full Text:PDF(539.7KB)

Effect of Purge Gas on the Reliability of a 266 nm Continuous-Wave Solid-State Laser
Hiroyuki WADA Michio OKA Koichi TATSUKI Masaki SAITO Shigeo KUBOTA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2004/12/01
Vol. E87-C  No. 12 ; pp. 2186-2188
Type of Manuscript:  LETTER
Category: Lasers, Quantum Electronics
Keyword: 
UV laserreliabilitypurge gasscattering
 Summary | Full Text:PDF(338.8KB)

A Framework for Reliable Data Delivery in Delay Bounded Overlay Multicast
Ki-Il KIM Dong-Kyun KIM Sang-Ha KIM 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2004/11/01
Vol. E87-B  No. 11 ; pp. 3356-3360
Type of Manuscript:  LETTER
Category: Network
Keyword: 
reliabilitydelay boundoverlay multicast
 Summary | Full Text:PDF(168.2KB)

Impact of Lead Free Soldering Processes on the Reliability of Electromechanical Switching Devices
Werner JOHLER 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2004/08/01
Vol. E87-C  No. 8 ; pp. 1225-1234
Type of Manuscript:  Special Section PAPER (Special Section on IS-EMD2003--Recent Technical Trend of Electro-Mechanical Devices)
Category: New Technology and Automotive Applications
Keyword: 
electromechanical devicestelecom- and signal relayslead free solderingreliabilitymixed assemblies
 Summary | Full Text:PDF(3MB)

A Mobile Multicast Protocol with Error Control for IP Networks
Chunhung Richard LIN Chang-Jai CHUNG 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2004/03/01
Vol. E87-B  No. 3 ; pp. 695-704
Type of Manuscript:  PAPER
Category: Network
Keyword: 
mobile IPmobile multicastreliabilityscalability
 Summary | Full Text:PDF(510.9KB)

An Efficient Algorithm for Computing the Reliability of Stochastic Binary Systems
Min-Sheng LIN 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2004/03/01
Vol. E87-D  No. 3 ; pp. 745-750
Type of Manuscript:  PAPER
Category: Algorithms
Keyword: 
reliabilitystochastic binary systemunion of products problemdifference graph
 Summary | Full Text:PDF(155KB)

Reliability of Athermal Fiber Bragg Grating Component with Negative Thermal Expansion Ceramic Substrate
Satoru YOSHIHARA Takahiro MATANO Hiroshi OOSHIMA Akihiko SAKAMOTO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2003/12/01
Vol. E86-C  No. 12 ; pp. 2501-2503
Type of Manuscript:  LETTER
Category: Optoelectronics
Keyword: 
fiber Bragg gratingreliabilitythermal expansionceramic substrateathermal
 Summary | Full Text:PDF(269.1KB)

Design and Analysis of a Highly-Available Network File Server Group
Fengjung LIU Chu-sing YANG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2003/11/01
Vol. E86-D  No. 11 ; pp. 2291-2299
Type of Manuscript:  Special Section PAPER (Special Issue on New Technologies in the Internet and their Applications)
Category: 
Keyword: 
NFSdata consistencyreliabilityserver group
 Summary | Full Text:PDF(1MB)

Reliability Analysis of GaN-Based LEDs for Solid State Illumination
Gaudenzio MENEGHESSO Simone LEVADA Roberto PIEROBON Fabiana RAMPAZZO Enrico ZANONI Anna CAVALLINI Manfredo MANFREDI Shawn DU Ivan ELIASHEVICH 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2003/10/01
Vol. E86-C  No. 10 ; pp. 2032-2038
Type of Manuscript:  Special Section PAPER (Special Issue on Heterostructure Microelectronics with TWHM2003)
Category: 
Keyword: 
high brightness GaN LEDreliabilitytraps
 Summary | Full Text:PDF(886.8KB)

Novel Built-In Current Sensor for On-Line Current Testing
Chul Ho KWAK Jeong Beom KIM 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2003/09/01
Vol. E86-C  No. 9 ; pp. 1898-1902
Type of Manuscript:  LETTER
Category: Integrated Electronics
Keyword: 
built-in current sensorcurrent testingVLSIreliability
 Summary | Full Text:PDF(985.6KB)

Reliability of a 2-Dimensional Consecutive k-out-of-n:F System with a Restriction in the Number of Failed Components
Tetsushi YUGE Masaharu DEHARE Shigeru YANAGI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2003/06/01
Vol. E86-A  No. 6 ; pp. 1535-1540
Type of Manuscript:  PAPER
Category: Reliability, Maintainability and Safety Analysis
Keyword: 
reliabilityapproximation2-dimensional consecutive k-out-of-n:F:system
 Summary | Full Text:PDF(279.1KB)

Influence of Silicone Vapor on Micro-Motor Reliability
Terutaka TAMAI Kiyoshi OGAWA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2003/06/01
Vol. E86-C  No. 6 ; pp. 885-890
Type of Manuscript:  Special Section PAPER (Special Issue on Recent Development of Electro-Mechanical Devices (IS-EMD 2002))
Category: Contact Phenomena
Keyword: 
silicone vapormicro-motorcontaminationreliabilitySiO2
 Summary | Full Text:PDF(598.1KB)

Reliability and Lifetime Estimation for Large-Scale Photonic Cross-Connect Switches of Photonic Networks
Kazuhiro NOGUCHI Masafumi KOGA 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2003/05/01
Vol. E86-B  No. 5 ; pp. 1530-1538
Type of Manuscript:  Special Section PAPER (Joint Special Issue on Recent Progress in Optoelectronics and Communications)
Category: 
Keyword: 
photonic networkoptical switchreliability
 Summary | Full Text:PDF(1.1MB)

Analysis of the Effect of Supplementing a Shortcut Link to Ring Networks
Takao MATSUMOTO Hitoshi OTSUKI 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2003/05/01
Vol. E86-B  No. 5 ; pp. 1641-1652
Type of Manuscript:  PAPER
Category: Network
Keyword: 
ring networkshortcutcostreliabilitypath
 Summary | Full Text:PDF(890.5KB)

Reliability of Low Temperature Poly-Si GOLD (Gate-Overlapped LDD) Structure TFTs
Tetsuo KAWAKITA Hidehiro NAKAGAWA Yukiharu URAOKA Takashi FUYUKI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2002/11/01
Vol. E85-C  No. 11 ; pp. 1854-1859
Type of Manuscript:  Special Section PAPER (Special Issue on Electronic Displays)
Category: Active Matrix Displays
Keyword: 
low temperature poly-SiTFTreliabilityGOLDsystem on panel
 Summary | Full Text:PDF(740.7KB)

Reliability-Based Mirroring of Servers in Distributed Networks
Akiko NAKANIWA Jun TAKAHASHI Hiroyuki EBARA Hiromi OKADA 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2002/02/01
Vol. E85-B  No. 2 ; pp. 540-549
Type of Manuscript:  PAPER
Category: Network Management/Operation
Keyword: 
load balancingreliabilitymirroringdistributed database systemInternet
 Summary | Full Text:PDF(658.6KB)

Reliability of InGaP and AlGaAs HBT
Noren PAN Roger E. WELSER Kevin S. STEVENS Charles R. LUTZ 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2001/10/01
Vol. E84-C  No. 10 ; pp. 1366-1372
Type of Manuscript:  INVITED PAPER (Joint Special Issue on Heterostructure Microelectronics with TWHM 2000 (Topical Workshop on Heterostructure Microelectronics 2000))
Category: III-V HBTs
Keyword: 
HBTMOCVDreliabilitymicrowave devices
 Summary | Full Text:PDF(380.2KB)

Hydrogen Degradation of InP HEMTs and GaAs PHEMTs
Jesus A. del ALAMO Roxann R. BLANCHARD Samuel D. MERTENS 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2001/10/01
Vol. E84-C  No. 10 ; pp. 1289-1293
Type of Manuscript:  INVITED PAPER (Joint Special Issue on Heterostructure Microelectronics with TWHM 2000 (Topical Workshop on Heterostructure Microelectronics 2000))
Category: Hetero-FETs & Their Integrated Circuits
Keyword: 
high-electron mobility transistorhydrogenreliabilityInPGaAs
 Summary | Full Text:PDF(606.9KB)

An Acquisition Method Using Correlation Mapping with False Alarm Penalty in M-ary/SS Systems
Yuuki OKAZAKI Masanori HAMAMURA Shin'ichi TACHIKAWA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2001/06/01
Vol. E84-A  No. 6 ; pp. 1572-1580
Type of Manuscript:  PAPER
Category: Spread Spectrum Technologies and Applications
Keyword: 
M-ary/SScorrelation mappingfalse alarm penaltyaverage acquisition timereliability
 Summary | Full Text:PDF(21.2MB)

Estimation of Imprint Failure Lifetime in FeRAM with Pt/SrBi2Ta2O9/Pt Capacitor
Young Min KANG Seaung Suk LEE Beelyong YANG Choong Heui CHUNG Hun Woo KYE Suk Kyoung HONG Nam Soo KANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2001/06/01
Vol. E84-C  No. 6 ; pp. 757-762
Type of Manuscript:  Special Section PAPER (Special Issue on Nonvolatile Memories)
Category: FeRAMs
Keyword: 
ferroelectricnonvolatilememoryFeRAMimprintreliability
 Summary | Full Text:PDF(480.4KB)

Highly Reliable and High Power 980 nm Pump Laser Diode Module for Undersea Cable Systems
Masashi USAMI Yuichi MATSUSHIMA Hideyoshi HORIE Hideaki KANEDA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2001/05/01
Vol. E84-C  No. 5 ; pp. 639-647
Type of Manuscript:  INVITED PAPER (Joint Special Issue on Recent Progress in Optoelectronics and Communications)
Category: Optical Active Devices and Modules
Keyword: 
980-nm pump laserEDFAWDMundersea systemreliability
 Summary | Full Text:PDF(789.4KB)

Highly Reliable and High Power 980 nm Pump Laser Diode Module for Undersea Cable Systems
Masashi USAMI Yuichi MATSUSHIMA Hideyoshi HORIE Hideaki KANEDA 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2001/05/01
Vol. E84-B  No. 5 ; pp. 1265-1273
Type of Manuscript:  INVITED PAPER (Joint Special Issue on Recent Progress in Optoelectronics and Communications)
Category: Optical Active Devices and Modules
Keyword: 
980-nm pump laserEDFAWDMundersea systemreliability
 Summary | Full Text:PDF(788.6KB)

Reliable Multicast Protocol with a Representative Acknowledgment Scheme for Wireless Systems
Yasuhiko INOUE Masataka IIZUKA Hitoshi TAKANASHI Masahiro MORIKURA 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2001/04/01
Vol. E84-B  No. 4 ; pp. 853-862
Type of Manuscript:  Special Section PAPER (Special Issue on Mobile Multimedia Communications)
Category: 
Keyword: 
multicastreliabilityretransmissionstation group
 Summary | Full Text:PDF(1.1MB)

New Self-Healing Scheme that Realizes Multiple Reliability on ATM Networks
Taishi YAHARA Ryutaro KAWAMURA 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2000/12/25
Vol. E83-B  No. 12 ; pp. 2615-2625
Type of Manuscript:  PAPER
Category: Switching
Keyword: 
restorationself-healingfailurereliabilityATM
 Summary | Full Text:PDF(209.5KB)

A Generalization of Consecutive k-out-of-n:G Systems
Min-Sheng LIN Ming-Sang CHANG Deng-Jyi CHEN 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2000/06/25
Vol. E83-D  No. 6 ; pp. 1309-1313
Type of Manuscript:  LETTER
Category: Fault Tolerance
Keyword: 
reliabilityconsecutive-k-out-of-n:G system, distributed computing system
 Summary | Full Text:PDF(167.2KB)

Optimum Order Time for a Spare Part Inventory System Modeled by a Non-Regenerative Stochastic Petri Net
Qun JIN Richard F. VIDALE Yoshio SUGASAWA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2000/05/25
Vol. E83-A  No. 5 ; pp. 818-827
Type of Manuscript:  Special Section PAPER (Special Section on Reliability Theory and Its Applications)
Category: 
Keyword: 
maintenanceMarkov processesPetri netsoptimizationreliability
 Summary | Full Text:PDF(783.7KB)

On the Concept of "Stability" in Asynchronous Distributed Decision-Making Systems
Tony S. LEE Sumit GHOSH 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2000/05/25
Vol. E83-B  No. 5 ; pp. 1023-1038
Type of Manuscript:  Special Section PAPER (IEICE/IEEE Joint Special Issue on Autonomous Decentralized Systems)
Category: Real Time Control
Keyword: 
stabilityinstabilityreliabilitycatastrophic failureperformanceasynchronous distributed algorithmscomplexitydecision-making
 Summary | Full Text:PDF(501.9KB)

Digital Watermarking Technique for Motion Pictures Based on Quantization
Hiroshi OGAWA Takao NAKAMURA Atsuki TOMIOKA Youichi TAKASHIMA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2000/01/25
Vol. E83-A  No. 1 ; pp. 77-89
Type of Manuscript:  Special Section PAPER (Special Section on Cryptography and Information Security)
Category: 
Keyword: 
motion picture watermarkingadaptive quantizationreliabilitysoft decisionMPEG
 Summary | Full Text:PDF(1.3MB)

Reliability of AlGaAs and InGaP Heterojunction Bipolar Transistors
Noren PAN Roger E. WELSER Charles R. LUTZ James ELLIOT Jesse P. RODRIGUES 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1999/11/25
Vol. E82-C  No. 11 ; pp. 1886-1894
Type of Manuscript:  INVITED PAPER (Special Issue on High-Frequency/High-Speed Devices for Information and Communication Systems in the 21st Century)
Category: RF Power Devices
Keyword: 
HBTInGaP/GaAs HBTsAlGaAs/GaAs HBTsMOCVDreliabilitymicrowave devices
 Summary | Full Text:PDF(725.8KB)

Highly Sensitive OBIRCH System for Fault Localization and Defect Detection
Kiyoshi NIKAWA Shoji INOUE 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1998/07/25
Vol. E81-D  No. 7 ; pp. 743-748
Type of Manuscript:  Special Section PAPER (Special Issue on Test and Diagnosis of VLSI)
Category: Beam Testing/Diagnosis
Keyword: 
VLSI chipfault localizationmetal line defect detectionhigh resistivityTiSiAlreliabilityyieldfailure analysis
 Summary | Full Text:PDF(916.7KB)

Application of Circuit-Level Hot-Carrier Reliability Simulation to Memory Design
Peter M. LEE Tsuyoshi SEO Kiyoshi ISE Atsushi HIRAISHI Osamu NAGASHIMA Shoji YOSHIDA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1998/04/25
Vol. E81-C  No. 4 ; pp. 595-601
Type of Manuscript:  PAPER
Category: Electronic Circuits
Keyword: 
hot-carrier degradationreliabilitydevice lifetimecircuit simulationSRAMDRAM
 Summary | Full Text:PDF(750KB)

Effect of Zr/Ti Ratio on the Reliability Characteristics Behavior of Sol-Gel Derived PZT Films on Pt/IrO2 Electrode
Katsuyoshi MATSUURA Kazuaki TAKAI Tetsuro TAMURA Hiroshi ASHIDA Seigen OTANI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1998/04/25
Vol. E81-C  No. 4 ; pp. 528-536
Type of Manuscript:  Special Section PAPER (Special Issue on Advanced Memory Devices Using High-Dielectric-Constant and Ferroelectric Thin Films)
Category: 
Keyword: 
PZTsol-gelIrO2Zr/Ti ratioreliability
 Summary | Full Text:PDF(1.1MB)

Reliability of Sn-Sb Solder for Mounting Si Chip and Passive Elements on Insulated Metal Substrate
Yasutoshi KURIHARA Tsuneo ENDOH 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1998/03/25
Vol. E81-C  No. 3 ; pp. 439-446
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
reliabilitySn-Sb solderinsulated metal substrateSi chippassive element
 Summary | Full Text:PDF(1011KB)

Architecture of a Multigigabit ATM Core Switch for the B-ISDN
Erwin P. RATHGEB 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 1998/02/25
Vol. E81-B  No. 2 ; pp. 251-257
Type of Manuscript:  Special Section PAPER (Special Issue on ATM Switching Systems for future B-ISDN)
Category: ATM switching architecture
Keyword: 
ATM switchreliabilityATM switch fabricimplementation
 Summary | Full Text:PDF(851.9KB)

Reliability Modeling of Declustered-Parity RAID Considering Uncorrectable Bit Errors
Xuefeng WU Jie LI Hisao KAMEDA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1997/08/25
Vol. E80-A  No. 8 ; pp. 1508-1515
Type of Manuscript:  PAPER
Category: Reliability and Fault Analysis
Keyword: 
uncorrectable bit errorsreliabilityanalytic modeldisk arraysRAID
 Summary | Full Text:PDF(725.1KB)

Three-Mode Failure Model for Reliability Analysis of Distributed Programs
Tatsuhiro TSUCHIYA Yoshiaki KAKUDA Tohru KIKUNO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1997/01/25
Vol. E80-D  No. 1 ; pp. 3-9
Type of Manuscript:  Special Section PAPER (Special Issue on Fault-Tolerant Computing)
Category: Distributed Systems
Keyword: 
distributed systemdistributed programsreliability3-mode failurefile spanning tree
 Summary | Full Text:PDF(512.3KB)

High Responsivity, Low Dark Current, and Highly Reliable Operation of InGaAlAs Waveguide Photodiodes for Optical Hybrid Integration
Hitoshi NAKAMURA Masato SHISHIKURA Shigehisa TANAKA Yasunobu MATSUOKA Tsunao ONO Takao MIYAZAKI Shinji TSUJI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1997/01/25
Vol. E80-C  No. 1 ; pp. 41-46
Type of Manuscript:  Special Section PAPER (Special Issue on Devices, Packaging Technology, and Subsystems for the Optical Access Network)
Category: 
Keyword: 
optical accessoptical platformhybrid integrationplanar lightwave circuitwaveguide photodiodephotodiodemolecular beam epitaxypassivationreliability
 Summary | Full Text:PDF(582.3KB)

A 250 mV Bit-Line Swing Scheme for 1-V Operating Gigabit Scale DRAMs
Tsuneo INABA Daisaburo TAKASHIMA Yukihito OOWAKI Tohru OZAKI Shigeyoshi WATANABE Takashi OHSAWA Kazunori OHUCHI Hiroyuki TANGO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/12/25
Vol. E79-C  No. 12 ; pp. 1699-1706
Type of Manuscript:  Special Section PAPER (Special Issue on Low-Power LSI Technologies)
Category: 
Keyword: 
DRAMpower dissipationreliabilitybit-linewordlinesmall swingthreshold voltagesense amplifiermemory cell
 Summary | Full Text:PDF(772.8KB)

Striping in a Disk Array with Data/Parity Placement Scheme RM2 Tolerating Double Disk Failures*
Chan-Ik PARK 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1996/08/25
Vol. E79-D  No. 8 ; pp. 1072-1085
Type of Manuscript:  Special Section PAPER (Special Issue on Architectures, Algorithms and Networks for Massively Parallel Computing)
Category: Disk array
Keyword: 
data placementdisk arrayperformancereliabilitystriping
 Summary | Full Text:PDF(839KB)

Test Structures and a Modified Transmission Line Pulse System for the Study of Electrostatic Discharge
Robert A. ASHTON 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/02/25
Vol. E79-C  No. 2 ; pp. 158-164
Type of Manuscript:  Special Section PAPER (Special Issue on Microelectronic Test Structures)
Category: Device and Circuit Characterization
Keyword: 
integrated electronicssemiconductor materials and devicesESDtest structuresreliability
 Summary | Full Text:PDF(554.3KB)

A Novel Threshold Voltage Distribution Measuring Technique for Flash EEPROM Devices
Toshihiko HIMENO Naohiro MATSUKAWA Hiroaki HAZAMA Koji SAKUI Masamitsu OSHIKIRI Kazunori MASUDA Kazushige KANDA Yasuo ITOH Jin-ichi MIYAMOTO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/02/25
Vol. E79-C  No. 2 ; pp. 145-151
Type of Manuscript:  Special Section PAPER (Special Issue on Microelectronic Test Structures)
Category: Device and Circuit Characterization
Keyword: 
flash memoryVth distributionreliabilityNAND flashnonvolatile memory
 Summary | Full Text:PDF(806.8KB)

An Optimum Logical-Design Scheme for Flexible Multi-QoS ATM Networks Guaranteeing Reliability
Eiji OKI Naoaki YAMANAKA 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 1995/07/25
Vol. E78-B  No. 7 ; pp. 1016-1024
Type of Manuscript:  Special Section PAPER (Special Issue on Multimedia Computer Networks)
Category: 
Keyword: 
ATMQoSnetwork designreliabilitydisjoint route
 Summary | Full Text:PDF(670.4KB)

Design of Highly Reliable Optical Fiber Cable Network in Access Networks
Motoi IWASHITA Hisao OIKAWA Hideo IMANAKA Ryuji TOYOSHIMA 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 1995/07/25
Vol. E78-B  No. 7 ; pp. 1033-1042
Type of Manuscript:  PAPER
Category: Communication Networks and Service
Keyword: 
communication networks and servicesnetwork designreliabilityheuristic algorithmsaccess networks
 Summary | Full Text:PDF(783.5KB)

A Recursive Matrix-Calculation Method for Disjoint Path Search with Hop Link Number Constraints
Eiji OKI Naoaki YAMANAKA 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 1995/05/25
Vol. E78-B  No. 5 ; pp. 769-774
Type of Manuscript:  LETTER
Category: Communication Networks and Service
Keyword: 
disjoint pathreliabilitymatrix calculationnetwork design
 Summary | Full Text:PDF(411.8KB)

Water Sensing Method with OTDR and Optical Sensor for Non-pressurized Optical Fiber Cable System
Seiji TAKASHIMA Masaaki KAWASE Shigeru TOMITA 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 1994/06/25
Vol. E77-B  No. 6 ; pp. 794-799
Type of Manuscript:  PAPER
Category: Optical Communication
Keyword: 
communication cableoptical fiberwater sensingreliability
 Summary | Full Text:PDF(414.1KB)

Defect Detection of Passivation Layer by a Bias-Free Cu Decoration Method
Tetsuaki WADA Shinji NAKANO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/04/25
Vol. E77-C  No. 4 ; pp. 585-589
Type of Manuscript:  Special Section PAPER (Special Issue on LSI Failure Analysis)
Category: 
Keyword: 
semiconductorpassivationdefectreliabilityhumidity test
 Summary | Full Text:PDF(975.4KB)

Evaluation of Plasma Damage to Gate Oxide
Yukiharu URAOKA Koji ERIGUCHI Tokuhiko TAMAKI Kazuhiko TSUJI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/03/25
Vol. E77-C  No. 3 ; pp. 453-458
Type of Manuscript:  Special Section PAPER (Special Issue on Quarter Micron Si Device and Process Technologies)
Category: Process Technology
Keyword: 
QBDgate oxideplasmareliabilitydamagephoton emissionLOCOSthinning
 Summary | Full Text:PDF(711.8KB)

Total High Performance Time and Design of Degradable Real-Time Systems
Masaharu AKATSU Tomohiro MURATA Kenzo KURIHARA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1994/03/25
Vol. E77-A  No. 3 ; pp. 510-516
Type of Manuscript:  Special Section PAPER (Special Section on the 6th Karuizawa Workshop on Circuits and Systems)
Category: Concurrent Systems, Discrete Event Systems and Petri Nets
Keyword: 
availabilityreliabilityperformancefault-tolerancemodelingPetri nets
 Summary | Full Text:PDF(644.2KB)

Reliability of a 3-State System Subject to Flow Quantity Constraint
Tetsushi YUGE Masafumi SASAKI Shigeru YANAGI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1994/01/25
Vol. E77-A  No. 1 ; pp. 129-133
Type of Manuscript:  Special Section PAPER (Special Section on Reliability)
Category: System Reliability
Keyword: 
open failureshort failure3-statej or more separate pathsreliability
 Summary | Full Text:PDF(417.9KB)

The Enhancement of Electromigration Lifetime under High Frequency Pulsed Conditions
Kazunori HIRAOKA Kazumitsu YASUDA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1994/01/25
Vol. E77-A  No. 1 ; pp. 195-203
Type of Manuscript:  Special Section PAPER (Special Section on Reliability)
Category: Reliability Testing
Keyword: 
fault analysistesting and verificationreliabilityavailability and vulnerability
 Summary | Full Text:PDF(800.2KB)

Via Electromigration Characteristics in Aluminum Based Multilevel Interconnection
Takahisa YAMAHA Masaru NAITO Tadahiko HOTTA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1994/01/25
Vol. E77-A  No. 1 ; pp. 187-194
Type of Manuscript:  Special Section PAPER (Special Section on Reliability)
Category: Failure Physics and Failure Analysis
Keyword: 
reliabilityelectromigrationmetallizationvia contactmultilevel interconnectionlaminated interconnectionsaluminum
 Summary | Full Text:PDF(896.2KB)

Reliability of Low-Noise HEMTs under Gamma-Ray Irradiation
Yasunobu SAITO Fumio SASAKI Hisao KAWASAKI Hiroshi ISHIMURA Hirokuni TOKUDA Motoharu OHTOMO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1993/09/25
Vol. E76-C  No. 9 ; pp. 1379-1383
Type of Manuscript:  Special Section PAPER (Special Issue on Heterostructure Electron Devices)
Category: 
Keyword: 
reliabilityHEMTγ-raydegradation
 Summary | Full Text:PDF(391.2KB)

Effects of Synchrotron X-Ray Irradiation on Hot Carrier Reliability in Subquarter-Micrometer NMOSFETs
Toshiaki TSUCHIYA Mitsuru HARADA Kimiyoshi DEGUCHI Tadahito MATSUDA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1993/04/25
Vol. E76-C  No. 4 ; pp. 506-510
Type of Manuscript:  INVITED PAPER (Special Issue on Sub-Half Micron Si Device and Process Technologies)
Category: Device Technology
Keyword: 
MOSFETreliabilityhot carriersynchrotron X-ray
 Summary | Full Text:PDF(473.4KB)

A New Technique for Evaluating Gate Oxide Reliability Using a Photon Emission Method
Yukiharu URAOKA Kazuhiko TSUJI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1993/04/25
Vol. E76-C  No. 4 ; pp. 519-524
Type of Manuscript:  Special Section PAPER (Special Issue on Sub-Half Micron Si Device and Process Technologies)
Category: Device Technology
Keyword: 
reliabilityphoton emissionTDDBgate oxideLOCOS
 Summary | Full Text:PDF(588.9KB)

1/5 Power Law in PN-Junction Failure Mechanism Caused by Electrical-Over-Stress
Yutaka TAJIMA Kunihiro ASADA Takuo SUGANO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1992/02/25
Vol. E75-C  No. 2 ; pp. 207-215
Type of Manuscript:  Special Section PAPER (Special Issue on Selected Papers from '91 VPAD)
Category: 
Keyword: 
reliabilityfailurepn-junctionsiliconelectrostatic-discharge
 Summary | Full Text:PDF(615.1KB)