Keyword : quality of a bit


A Dependable SRAM with 7T/14T Memory Cells
Hidehiro FUJIWARA Shunsuke OKUMURA Yusuke IGUCHI Hiroki NOGUCHI Hiroshi KAWAGUCHI Masahiko YOSHIMOTO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2009/04/01
Vol. E92-C  No. 4 ; pp. 423-432
Type of Manuscript:  Special Section PAPER (Special Section on Low-Leakage, Low-Voltage, Low-Power and High-Speed Technologies for System LSIs in Deep-Submicron Era)
Category: 
Keyword: 
SRAMdependabilityquality of a bit
 Summary | Full Text:PDF(1.5MB)