Publication: IEICE TRANSACTIONS on Information and Systems
Publication Date: 1998/07/20
Vol. E81-D
No. 7
pp. 697-705
Type of Manuscript: Special Section PAPER (Special Issue on Test and Diagnosis of VLSI)
Category: Fault Diagnosis
Keyword:
fault diagnosis,
transistor leakage fault,
IDDQ,
primary output,
fault simulation,
diagnostic test generation,
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