IEICE SEARCH SYSTEM

Keyword : oxide

Al-Zn-Sn-O Thin Film Transistors with Top and Bottom Gate Structure for AMOLED Doo-Hee CHO Sang-Hee Ko PARK Shinhyuk YANG Chunwon BYUN Min Ki RYU Jeong-Ik LEE Chi-Sun HWANG Sung Min YOON Hye Yong CHU Kyoung Ik CHO
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2009/11/01 Vol. E92-C No. 11 pp. 1340-1346 Type of Manuscript: Special Section PAPER (Special Section on Electronic Displays) Category: INVITED Keyword: thin film transistor, oxide, AMOLED, transparent,
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RFCV Test Structure Design for a Selected Frequency Range Wutthinan JEAMSAKSIRI Abdelkarim MERCHA Javier RAMOS Stefaan DECOUTERE Florence CUBAYNES
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2005/05/01 Vol. E88-C No. 5 pp. 817-823 Type of Manuscript: Special Section PAPER (Special Section on Microelectronic Test Structures) Category: Keyword: capacitance, CV, gate dielectric, impedance, MOSFET, nitride, oxide, RF, S-parameters,
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Elimination of Negative Charge-Up during High Current Ion Implantation Kazunobu MAMENO Atsuhiro NISHIDA Hideharu NAGASAWA Hideaki FUJIWARA Koji SUZUKI Kiyoshi YONEDA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1994/03/20 Vol. E77-C No. 3 pp. 459-463 Type of Manuscript: Special Section PAPER (Special Issue on Quarter Micron Si Device and Process Technologies) Category: Process Technology Keyword: ion implantation, charge-up, electron shower, oxide, dielectric breakdown,
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Water Desorption Control of Interlayer Dielectrics to Reduce MOSFET Hot Carrier Degradation Kimiaki SHIMOKAWA Takashi USAMI Masaki YOSHIMARU
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1994/03/20 Vol. E77-C No. 3 pp. 473-479 Type of Manuscript: Special Section PAPER (Special Issue on Quarter Micron Si Device and Process Technologies) Category: Process Technology Keyword: water desorption, oxide, PECVD, pore, hot-carrier, interlayer,
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