Keyword : open faults

Ramp Voltage Testing for Detecting Interconnect Open Faults
Yukiya MIURA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/03/01
Vol. E91-D  No. 3  pp. 700-705
Type of Manuscript: Special Section PAPER (Special Section on Test and Verification of VLSIs)
Category: Defect-Based Testing
Keyword: 
CMOS circuits,  defect oriented testing,  open faults,  ramp voltage, 
  Summary |  Full Text:PDF (370.1KB)
A Learning Algorithm for Fault Tolerant Feedforward Neural Networks
Nait Charif HAMMADI  Hideo ITO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1997/01/20
Vol. E80-D  No. 1  pp. 21-27
Type of Manuscript: Special Section PAPER (Special Issue on Fault-Tolerant Computing)
Category: Redundancy Techniques
Keyword: 
feedforward neural network,  learning algorithm,  relevance of synaptic weights,  essential link,  open faults, 
  Summary |  Full Text:PDF (529.4KB)