Keyword : on-chip monitor


All-Digital PMOS and NMOS Process Variability Monitor Utilizing Shared Buffer Ring and Ring Oscillator
Tetsuya IIZUKA Kunihiro ASADA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2012/04/01
Vol. E95-C  No. 4 ; pp. 627-634
Type of Manuscript:  Special Section PAPER (Special Section on Solid-State Circuit Design – Architecture, Circuit, Device and Design Methodology)
Category: 
Keyword: 
process variabilityall digitalon-chip monitorbuffer ring
 Summary | Full Text:PDF(2.2MB)

On-Chip In-Place Measurements of Vth and Signal/Substrate Response of Differential Pair Transistors
Yoji BANDO Satoshi TAKAYA Toru OHKAWA Toshiharu TAKARAMOTO Toshio YAMADA Masaaki SOUDA Shigetaka KUMASHIRO Tohru MOGAMI Makoto NAGATA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2012/01/01
Vol. E95-C  No. 1 ; pp. 137-145
Type of Manuscript:  PAPER
Category: Electronic Circuits
Keyword: 
on-chip monitorsubstrate noisedifferential amplifier
 Summary | Full Text:PDF(2.1MB)

A Continuous-Time Waveform Monitoring Technique for On-Chip Power Noise Measurements in VLSI Circuits
Yoji BANDO Satoshi TAKAYA Toru OHKAWA Toshiharu TAKARAMOTO Toshio YAMADA Masaaki SOUDA Shigetaka KUMASHIRO Tohru MOGAMI Makoto NAGATA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/04/01
Vol. E94-C  No. 4 ; pp. 495-503
Type of Manuscript:  Special Section PAPER (Special Section on Circuits and Design Techniques for Advanced Large Scale Integration)
Category: 
Keyword: 
on-chip monitorpower supply noise
 Summary | Full Text:PDF(2.4MB)

All-Digital On-Chip Monitor for PMOS and NMOS Process Variability Utilizing Buffer Ring with Pulse Counter
Tetsuya IIZUKA Jaehyun JEONG Toru NAKURA Makoto IKEDA Kunihiro ASADA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2011/04/01
Vol. E94-C  No. 4 ; pp. 487-494
Type of Manuscript:  Special Section PAPER (Special Section on Circuits and Design Techniques for Advanced Large Scale Integration)
Category: 
Keyword: 
process variabilityall digitalon-chip monitorbuffer ringNBTIPBTI
 Summary | Full Text:PDF(1.1MB)

Measurement-Based Analysis of Electromagnetic Immunity in LSI Circuit Operation
Kouji ICHIKAWA Yuki TAKAHASHI Yukihiko SAKURAI Takahiro TSUDA Isao IWASE Makoto NAGATA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/06/01
Vol. E91-C  No. 6 ; pp. 936-944
Type of Manuscript:  Special Section PAPER (Special Section on Analog Circuits and Related SoC Integration Technologies)
Category: 
Keyword: 
integrated circuitelectro magnetic interferenceon-chip monitorimmunity
 Summary | Full Text:PDF(1.5MB)

On-Chip Multi-Channel Monitoring for Analog Circuit Diagnosis in Systems-on-Chip Integration
Koichiro NOGUCHI Takushi HASHIDA Makoto NAGATA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2007/06/01
Vol. E90-C  No. 6 ; pp. 1189-1196
Type of Manuscript:  Special Section PAPER (Special Section on Analog Circuits and Related SoC Integration Technologies)
Category: 
Keyword: 
SoCanalog diagnosison-chip monitor
 Summary | Full Text:PDF(1.5MB)

An On-Chip Multi-Channel Rail-to-Rail Signal Monitoring Technique for Sub-100-nm Digital Signal Integrity
Koichiro NOGUCHI Makoto NAGATA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2006/06/01
Vol. E89-C  No. 6 ; pp. 761-768
Type of Manuscript:  Special Section PAPER (Special Section on Analog Circuit and Device Technologies)
Category: 
Keyword: 
signal integritysubstrate crosstalkdelay variationon-chip monitor
 Summary | Full Text:PDF(1.1MB)