Keyword : machine vision


Automatic Mura Detection for Display Film Using Mask Filtering in Wavelet Transform
Jong-Seung PARK Seung-Ho LEE 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2015/03/01
Vol. E98-D  No. 3 ; pp. 737-740
Type of Manuscript:  LETTER
Category: Image Recognition, Computer Vision
Keyword: 
machine visionmura detectionmura maskmask filtering
 Summary | Full Text:PDF(954.8KB)

3D Inspection on Wafer Solder Bumps Using Binary Grating Projection in Integrated Circuit Manufacturing
Shu YUAN Dongping TIAN Yanxing ZENG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2006/05/01
Vol. E89-C  No. 5 ; pp. 602-607
Type of Manuscript:  Special Section PAPER (Special Section on Fundamental and Application of Advanced Semiconductor Devices)
Category: Si Devices and Processes
Keyword: 
machine visionstructured light rangingwave-front aberration correction
 Summary | Full Text:PDF(694.4KB)

Automatic Detection of Region-Mura Defect in TFT-LCD
Jae Yeong LEE Suk In YOO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2004/10/01
Vol. E87-D  No. 10 ; pp. 2371-2378
Type of Manuscript:  PAPER
Category: Image Processing and Video Processing
Keyword: 
machine visionimage segmentationregression diagnosticsindustrial inspectionvisual perception
 Summary | Full Text:PDF(884.8KB)

A Machine Vision Approach to Seam Sensing for High-Speed Robotic Sealing
Kenichi ARAKAWA Takao KAKIZAKI Shinji OMYO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2000/07/25
Vol. E83-D  No. 7 ; pp. 1353-1357
Type of Manuscript:  Special Section PAPER (Special Issue on Machine Vision Applications)
Category: 
Keyword: 
machine visionlaser rangefinderseam sealingindustrial robots
 Summary | Full Text:PDF(1.3MB)

Automatic Defect Classification in Visual Inspection of Semiconductors Using Neural Networks
Keisuke KAMEYAMA Yukio KOSUGI Tatsuo OKAHASHI Morishi IZUMITA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1998/11/25
Vol. E81-D  No. 11 ; pp. 1261-1271
Type of Manuscript:  PAPER
Category: Image Processing,Computer Graphics and Pattern Recognition
Keyword: 
machine visionsemiconductor manufacturingdefect classificationhigher-order neural network clusteringADC
 Summary | Full Text:PDF(1MB)

Morphology Based Thresholding for Character Extraction
Yasuko TAKAHASHI Akio SHIO Kenichiro ISHII 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1993/10/25
Vol. E76-D  No. 10 ; pp. 1208-1215
Type of Manuscript:  Special Section PAPER (Special Section on Machine Vision Applications)
Category: 
Keyword: 
image processingmathematical morphologycharacter extractionedge detectionmachine visionthresholding
 Summary | Full Text:PDF(1.5MB)