Keyword : information leakage


Power Noise Measurements of Cryptographic VLSI Circuits Regarding Side-Channel Information Leakage
Daisuke FUJIMOTO Noriyuki MIURA Makoto NAGATA Yuichi HAYASHI Naofumi HOMMA Takafumi AOKI Yohei HORI Toshihiro KATASHITA Kazuo SAKIYAMA Thanh-Ha LE Julien BRINGER Pirouz BAZARGAN-SABET Shivam BHASIN Jean-Luc DANGER 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2014/04/01
Vol. E97-C  No. 4 ; pp. 272-279
Type of Manuscript:  Special Section PAPER (Special Section on Solid-State Circuit Design,---,Architecture, Circuit, Device and Design Methodology)
Category: 
Keyword: 
information leakageside-channel attackcorrelation power analysisadvance encryption standard
 Summary | Full Text:PDF(4MB)

A Fast Power Current Simulation of Cryptographic VLSI Circuits for Side Channel Attack Evaluation
Daisuke FUJIMOTO Toshihiro KATASHITA Akihiko SASAKI Yohei HORI Akashi SATOH Makoto NAGATA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2013/12/01
Vol. E96-A  No. 12 ; pp. 2533-2541
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Device and Circuit Modeling and Analysis
Keyword: 
power supply currentelectromagnetic leakageinformation leakageAES
 Summary | Full Text:PDF(2.9MB)

Prevention of Information Leakage by Photo-Coupling in Smart Card
Sung-Shiou SHEN Jung-Hui CHIU 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2008/01/01
Vol. E91-A  No. 1 ; pp. 160-167
Type of Manuscript:  Special Section PAPER (Special Section on Cryptography and Information Security)
Category: Side Channel Attacks
Keyword: 
differential power analysiselectromagnetic analysis attacksinformation leakagesmart cardmulti-chip-module
 Summary | Full Text:PDF(682.6KB)