Keyword : highly observable testing


A Testable Design of Sequential Circuits under Highly Observable Condition
WEN Xiaoqing Kozo KINOSHITA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1992/05/25
Vol. E75-D  No. 3 ; pp. 334-341
Type of Manuscript:  PAPER
Category: Fault Tolerant Computing
Keyword: 
design for testabilityhighly observable testingfault diagnosissequential circuitcircuit modification
 Summary | Full Text:PDF(660.1KB)