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Keyword : gate delay model

An Approach for Reducing Leakage Current Variation due to Manufacturing Variability Tsuyoshi SAKATA Takaaki OKUMURA Atsushi KUROKAWA Hidenari NAKASHIMA Hiroo MASUDA Takashi SATO Masanori HASHIMOTO Koutaro HACHIYA Katsuhiro FURUKAWA Masakazu TANAKA Hiroshi TAKAFUJI Toshiki KANAMOTO
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2009/12/01 Vol. E92-A No. 12 pp. 3016-3023 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Device and Circuit Modeling and Analysis Keyword: low power, leakage, gate delay model, variation,
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Improvement in Computational Accuracy of Output Transition Time Variation Considering Threshold Voltage Variations Takaaki OKUMURA Atsushi KUROKAWA Hiroo MASUDA Toshiki KANAMOTO Masanori HASHIMOTO Hiroshi TAKAFUJI Hidenari NAKASHIMA Nobuto ONO Tsuyoshi SAKATA Takashi SATO
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2009/04/01 Vol. E92-A No. 4 pp. 990-997 Type of Manuscript: Special Section PAPER (Special Section on Advanced Technologies Emerging Mainly from the 21st Workshop on Circuits and Systems in Karuizawa) Category: Keyword: SSTA, output, transition time, gate delay model, process variation,
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Timing Analysis Considering Spatial Power/Ground Level Variation Masanori HASHIMOTO Junji YAMAGUCHI Hidetoshi ONODERA
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2007/12/01 Vol. E90-A No. 12 pp. 2661-2668 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Physical Design Keyword: timing analysis, power supply noise, gate delay model, power/ground level variation,
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