Keyword : fatigue property


Properties of Ferroelectric Memory with Ir System Materials as Electrodes
Naoki IZUMI Yoshikazu FUJIMORI Takashi NAKAMURA Akira KAMISAWA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1998/04/25
Vol. E81-C  No. 4 ; pp. 513-517
Type of Manuscript:  Special Section PAPER (Special Issue on Advanced Memory Devices Using High-Dielectric-Constant and Ferroelectric Thin Films)
Category: 
Keyword: 
ferroelectric thin filmsPb(Zr,Ti)O3FRAMfatigue propertyimprint propertyhysteresissol-gel methodIr system materialsSTCpoly-Si plugs
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