Keyword : electron beam testing


Hierarchical Fault Tracing for VLSIs with Bi-directional Busses from CAD Layout Data in the CAD-Linked EB Test System
Katsuyoshi MIURA Koji NAKAMAE Hiromu FUJIOKA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1997/03/25
Vol. E80-C  No. 3 ; pp. 498-502
Type of Manuscript:  LETTER
Category: Integrated Electronics
Keyword: 
bi-directional buscircuit extraction from CAD layoutelectron beam testingLSI
 Summary | Full Text:PDF(409.1KB)

Automatic Transistor-Level Performance Fault Tracing by Successive Circuit Extraction from CAD Layout Data for VLSI in the CAD-Linked EB Test System
Katsuyoshi MIURA Koji NAKAMAE hiromu FUJIOKA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1995/11/25
Vol. E78-C  No. 11 ; pp. 1607-1617
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
performance fault tracingcircuit extraction from CAD layoutelectron beam testingintegrated circuitsvacuum and beam technologies
 Summary | Full Text:PDF(929.7KB)

Cone/Block Methods for Logic Simulation Time Reduction in E-Beam Guided-Probe Diagnosis
Norio KUJI Kazuhiro SHIRAKAWA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/04/25
Vol. E77-C  No. 4 ; pp. 560-566
Type of Manuscript:  Special Section PAPER (Special Issue on LSI Failure Analysis)
Category: 
Keyword: 
logic simulationcone/block methodsguide-probe diagnosiselectron beam testing
 Summary | Full Text:PDF(588KB)

Efficient Dynamic Fault Imaging by Fully Utilizing CAD Data in CAD-Linked Electron Beam Test System
Koji NAKAMAE Hirohisa TANAKA Hideharu KUBOTA Hiromu FUJITA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/04/25
Vol. E77-C  No. 4 ; pp. 546-551
Type of Manuscript:  Special Section PAPER (Special Issue on LSI Failure Analysis)
Category: 
Keyword: 
vacuum and beam technologieselectron beam testingdynamic fault imagingCAD dataimage processing
 Summary | Full Text:PDF(609.4KB)

LSI Failure Analysis with CAD-Linked Electron Beam Test System and Its Cost Evaluation
Hiromu FUJIOKA Koji NAKAMAE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/04/25
Vol. E77-C  No. 4 ; pp. 535-545
Type of Manuscript:  INVITED PAPER (Special Issue on LSI Failure Analysis)
Category: 
Keyword: 
LSI failure analysiselectron beam testingCAD datacost evaluation
 Summary | Full Text:PDF(922.5KB)

Matching of DUT Interconnection Pattern with CAD Layout in CAD-Linked Electron Beam Test System
Koji NAKAMAE Ryo NAKAGAKI Katsuyoshi MIURA Hiromu FUJIOKA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/04/25
Vol. E77-C  No. 4 ; pp. 567-573
Type of Manuscript:  Special Section PAPER (Special Issue on LSI Failure Analysis)
Category: 
Keyword: 
vacuum and beam technologieselectron beam testingpattern matchingCAD layout
 Summary | Full Text:PDF(578.8KB)

Automatic Tracing of Transistor-Level Performance Faults with CAD-Linked Electron Beam Test System
Katsuyoshi MIURA Koji NAKAMAE Hiromu FUJIOKA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1994/03/25
Vol. E77-A  No. 3 ; pp. 539-545
Type of Manuscript:  PAPER
Category: Computer Aided Design (CAD)
Keyword: 
fault analysisfault tracingelectron beam testingperformance faulttransistor-level circuits
 Summary | Full Text:PDF(538.3KB)