Keyword : digital error correction


Design of a Digitally Error-Corrected Pipeline ADC Using Incomplete Settling of Pre-Charged Residue Amplifiers
Sung-Wook JUN Lianghua MIAO Keita YASUTOMI Keiichiro KAGAWA Shoji KAWAHITO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2013/06/01
Vol. E96-C  No. 6 ; pp. 828-837
Type of Manuscript:  Special Section PAPER (Special Section on Analog Circuits and Related SoC Integration Technologies)
Category: 
Keyword: 
analog-to-digital conversiondigital error correctionincomplete settling errorpre-charging technique
 Summary | Full Text:PDF(2.9MB)

SAR ADC Algorithm with Redundancy and Digital Error Correction
Tomohiko OGAWA Haruo KOBAYASHI Yosuke TAKAHASHI Nobukazu TAKAI Masao HOTTA Hao SAN Tatsuji MATSUURA Akira ABE Katsuyoshi YAGI Toshihiko MORI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2010/02/01
Vol. E93-A  No. 2 ; pp. 415-423
Type of Manuscript:  Special Section PAPER (Special Section on Analog Circuit Techniques and Related Topics)
Category: 
Keyword: 
SAR ADCdigital error correctionnon-binaryredundancy
 Summary | Full Text:PDF(632.9KB)

Technique to Improve the Performance of Time-Interleaved A-D Converters with Mismatches of Non-linearity
Koji ASAMI Takahide SUZUKI Hiroyuki MIYAJIMA Tetsuya TAURA Haruo KOBAYASHI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2009/02/01
Vol. E92-A  No. 2 ; pp. 374-380
Type of Manuscript:  Special Section PAPER (Special Section on Analog Circuit Techniques and Related Topics)
Category: 
Keyword: 
time-interleaved A-D convertersnon-linearityforeground calibrationdigital error correctionautomatic test equipment
 Summary | Full Text:PDF(730.2KB)

Algorithms for Digital Correction of ADC Nonlinearity
Haruo KOBAYASHI Hiroshi YAGI Takanori KOMURO Hiroshi SAKAYORI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2003/02/01
Vol. E86-A  No. 2 ; pp. 504-508
Type of Manuscript:  LETTER
Category: Analog Signal Processing
Keyword: 
ADCnonlinearitydigital error correctiondigital signal processingLSI tester
 Summary | Full Text:PDF(242.9KB)